P

Inventor

IZUHA KYOKO

JP43 patents
⚠️ This page may combine multiple inventors who share the name “IZUHA KYOKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOSHIBA KK

15 patents
US7194704B2Mar 20, 2007

Design layout preparing method

TOSHIBA KK61 citations97
US6440616B1Aug 27, 2002

Mask and method for focus monitoring

TOSHIBA KK63 citations96
US7571417B2Aug 4, 2009

Method and system for correcting a mask pattern design

TOSHIBA KK23 citations93
US6741334B2May 25, 2004

Exposure method, exposure system and recording medium

TOSHIBA KK28 citations92
US6667139B2Dec 23, 2003

Method of manufacturing semiconductor device

TOSHIBA KK35 citations92
US7925090B2Apr 12, 2011

Method of determining photo mask, method of manufacturing semiconductor device, and computer program product

TOSHIBA KK7 citations84
US7784020B2Aug 24, 2010

Semiconductor circuit pattern design method for manufacturing semiconductor device or liquid crystal display device

TOSHIBA KK8 citations84
US7250235B2Jul 31, 2007

Focus monitor method and mask

TOSHIBA KK15 citations84
US7108945B2Sep 19, 2006

Photomask having a focus monitor pattern

TOSHIBA KK16 citations84
US7788626B2Aug 31, 2010

Pattern data correction method, pattern checking method, pattern check program, photo mask producing method, and semiconductor device manufacturing method

TOSHIBA KK7 citations74
US7200833B2Apr 3, 2007

Calculating method, verification method, verification program and verification system for edge deviation quantity, and semiconductor device manufacturing method

TOSHIBA KK6 citations74
US7094504B2Aug 22, 2006

Mask, manufacturing method for mask, and manufacturing method for semiconductor device

TOSHIBA KK7 citations74
US7631287B2Dec 8, 2009

Calculating method, verification method, verification program and verification system for edge deviation quantity, and semiconductor device manufacturing method

TOSHIBA KK3 citations63
US7371483B2May 13, 2008

Method for manufacturing mask for focus monitoring, and method for manufacturing semiconductor device

TOSHIBA KK4 citations63
US7541136B2Jun 2, 2009

Mask, manufacturing method for mask, and manufacturing method for semiconductor device

TOSHIBA KK0 citations52

SONY CORP

13 patents
US8381160B2Feb 19, 2013

Manufacturing method, manufacturing program and manufacturing system for semiconductor device

SONY CORP5 citations84
US9846317B2Dec 19, 2017

Optical modulator, imaging device and display apparatus including a dielectric layer and an electrode comprising graphene

SONY CORP4 citations73
US9438834B2Sep 6, 2016

Solid-state imaging device, driving method thereof and electronic apparatus

SONY CORP2 citations63
US8028267B2Sep 27, 2011

Pattern designing method, pattern designing program and pattern designing apparatus

SONY CORP3 citations63
US7851236B2Dec 14, 2010

Film thickness prediction method, layout design method, mask pattern design method of exposure mask, and fabrication method of semiconductor integrated circuit

SONY CORP2 citations63
US10324317B2Jun 18, 2019

Light control device, imaging element, and imaging device, and light transmittance control method for light control device

SONY CORP0 citations52
US9761628B2Sep 12, 2017

Imaging element and imaging device

SONY CORP0 citations52
US9219090B2Dec 22, 2015

Solid-state image capturing device and electronic device

SONY CORP0 citations52
US9064983B2Jun 23, 2015

Solid-state imaging device and electronic equipment

SONY CORP1 citations52
US9419157B2Aug 16, 2016

Solid-state imaging device, manufacturing method and designing method thereof, and electronic device

SONY CORP1 citations51
US10381395B2Aug 13, 2019

Light control device with stacked light control layers

SONY CORP0 citations42
US10602084B2Mar 24, 2020

Imaging apparatus which performs compressive sensing reading data for a partitioned block output from an image sensor

SONY CORP0 citations41
US9435643B2Sep 6, 2016

Presumably defective portion decision apparatus, presumably defective portion decision method, fabrication method for semiconductor device and program

SONY CORP0 citations39

IZUHA KYOKO

11 patents
US8847135B2Sep 30, 2014

Solid-state imaging device, driving method thereof and electronic apparatus

IZUHA KYOKO5 citations84
US8185856B2May 22, 2012

Manufacturing method, manufacturing program and manufacturing system for adjusting signal delay in a semiconductor device

IZUHA KYOKO11 citations84
US9177984B2Nov 3, 2015

Solid-state imaging device and electronic apparatus having a solid-state imaging device

IZUHA KYOKO8 citations83
US8558158B2Oct 15, 2013

Solid-state imaging device, manufacturing method and designing method thereof, and electronic device

IZUHA KYOKO6 citations83
US8078996B2Dec 13, 2011

Method and system for correcting a mask pattern design

IZUHA KYOKO6 citations73
US8112724B2Feb 7, 2012

Method of designing semiconductor integrated circuit, apparatus for designing semiconductor integrated circuit, recording medium, and mask manufacturing method

IZUHA KYOKO2 citations62
US8490031B2Jul 16, 2013

Method, apparatus and program for adjusting feature dimensions to compensate for planarizing effects in the generation of mask data and manufacturing semiconductor device

IZUHA KYOKO2 citations60
US8839158B2Sep 16, 2014

Pattern designing method, pattern designing program and pattern designing apparatus

IZUHA KYOKO0 citations52
US8754968B2Jun 17, 2014

Solid-state imaging device and electronic equipment

IZUHA KYOKO0 citations52
US8605175B2Dec 10, 2013

Solid-state image capturing device including a photochromic film having a variable light transmittance, and electronic device including the solid-state image capturing device

IZUHA KYOKO1 citations52
US10163776B2Dec 25, 2018

Designing method of capacitive element in multilayer wirings for integrated circuit devices based on statistical process

IZUHA KYOKO0 citations41

SONY SEMICONDUCTOR SOLUTIONS CORP

3 patents

SHIMIZU KEISUKE

1 patent