P

Inventor

BASSIN KATHRYN A

US24 patents
⚠️ This page may combine multiple inventors who share the name “BASSIN KATHRYN A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

14 patents
US9052981B2Jun 9, 2015

System and method to map defect reduction data to organizational maturity profiles for defect projection modeling

IBM14 citations92
US8645921B2Feb 4, 2014

System and method to determine defect risks in software solutions

IBM14 citations92
US10185649B2Jan 22, 2019

System and method for efficient creation and reconciliation of macro and micro level test plans

IBM6 citations84
US9558464B2Jan 31, 2017

System and method to determine defect risks in software solutions

IBM9 citations84
US9292421B2Mar 22, 2016

System and method for resource modeling and simulation in test planning

IBM4 citations83
US9753838B2Sep 5, 2017

System and method to classify automated code inspection services defect output for defect analysis

IBM5 citations82
US9594671B2Mar 14, 2017

System and method for resource modeling and simulation in test planning

IBM2 citations72
US9262736B2Feb 16, 2016

System and method for efficient creation and reconciliation of macro and micro level test plans

IBM1 citations62
US8352237B2Jan 8, 2013

System and method for system integration test (SIT) planning

IBM4 citations62
US9442821B2Sep 13, 2016

System and method to classify automated code inspection services defect output for defect analysis

IBM2 citations61
US8924936B2Dec 30, 2014

System and method to classify automated code inspection services defect output for defect analysis

IBM3 citations61
US10372593B2Aug 6, 2019

System and method for resource modeling and simulation in test planning

IBM0 citations51
US9710257B2Jul 18, 2017

System and method to map defect reduction data to organizational maturity profiles for defect projection modeling

IBM0 citations51
US9176844B2Nov 3, 2015

System and method to classify automated code inspection services defect output for defect analysis

IBM0 citations51

BASSIN KATHRYN A

9 patents

BAKER IAN E

1 patent