Inventor
YU TA LEE
CN91 patents
⚠️ This page may combine multiple inventors who share the name “YU TA LEE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
WINBOND ELECTRONICS CORP
26 patentsUS5856214AJan 5, 1999
Method of fabricating a low voltage zener-triggered SCR for ESD protection in integrated circuits
WINBOND ELECTRONICS CORP140 citations98
US5631793AMay 20, 1997
Capacitor-couple electrostatic discharge protection circuit
WINBOND ELECTRONICS CORP142 citations98
US5946175AAug 31, 1999
Secondary ESD/EOS protection circuit
WINBOND ELECTRONICS CORP78 citations96
US5869873AFeb 9, 1999
Electrostatic discharge protection circuit having eprom
WINBOND ELECTRONICS CORP54 citations96
US5838050ANov 17, 1998
Hexagon CMOS device
WINBOND ELECTRONICS CORP83 citations96
US5742084AApr 21, 1998
Punchthrough-triggered ESD protection circuit through gate-coupling
WINBOND ELECTRONICS CORP82 citations96
US5714784AFeb 3, 1998
Electrostatic discharge protection device
WINBOND ELECTRONICS CORP90 citations96
US6473282B1Oct 29, 2002
Latch-up protection circuit for integrated circuits biased with multiple power supplies and its method
WINBOND ELECTRONICS CORP21 citations93
US6353237B1Mar 5, 2002
ESD protection circuit triggered by diode
WINBOND ELECTRONICS CORP38 citations93
US6320230B1Nov 20, 2001
Silicon-controlled rectifier integral with output buffer
WINBOND ELECTRONICS CORP22 citations93
US6274910B1Aug 14, 2001
ESD protection circuit for SOI technology
WINBOND ELECTRONICS CORP26 citations93
US6157070ADec 5, 2000
Protection circuit against latch-up in a multiple-supply integrated circuit
WINBOND ELECTRONICS CORP23 citations93
US6055143AApr 25, 2000
Electrostatic discharge protection circuit triggered by EPROM
WINBOND ELECTRONICS CORP22 citations93
US6031405AFeb 29, 2000
ESD protection circuit immune to latch-up during normal operation
WINBOND ELECTRONICS CORP39 citations93
US6014298AJan 11, 2000
Electrostatic protection circuit of an integrated circuit
WINBOND ELECTRONICS CORP25 citations93
US6014305AJan 11, 2000
ESD event detector
WINBOND ELECTRONICS CORP21 citations93
US5998245ADec 7, 1999
Method for making seal-ring structure with ESD protection device
WINBOND ELECTRONICS CORP21 citations93
US5995354ANov 30, 1999
Electrostatic discharge protection circuit for recording electrostatic discharge event
WINBOND ELECTRONICS CORP30 citations93
US5962876AOct 5, 1999
Low voltage triggering electrostatic discharge protection circuit
WINBOND ELECTRONICS CORP33 citations93
US5949634ASep 7, 1999
Electrostatic discharge protection circuit triggered by MOS transistor
WINBOND ELECTRONICS CORP20 citations93
US5751042AMay 12, 1998
Internal ESD protection circuit for semiconductor devices
WINBOND ELECTRONICS CORP35 citations93
US5742085AApr 21, 1998
Low-voltage trigger electrostatic discharge protection circuit
WINBOND ELECTRONICS CORP29 citations93
US5715127AFeb 3, 1998
Method for preventing electrostatic discharge failure in an integrated circuit package
WINBOND ELECTRONICS CORP22 citations93
US5777368AJul 7, 1998
Electrostatic discharge protection device and its method of fabrication
WINBOND ELECTRONICS CORP38 citations92
US6147369ANov 14, 2000
SCR and current divider structure of electrostatic discharge protective circuit
WINBOND ELECTRONICS CORP32 citations91
US5831316ANov 3, 1998
Multi-finger MOS transistor element
WINBOND ELECTRONICS CORP38 citations90
TAIWAN SEMICONDUCTOR MFG
20 patentsUS6555458B1Apr 29, 2003
Fabricating an electrical metal fuse
TAIWAN SEMICONDUCTOR MFG78 citations98
US6580145B2Jun 17, 2003
Low programming voltage anti-fuse structure
TAIWAN SEMICONDUCTOR MFG56 citations96
US6507087B1Jan 14, 2003
Silicide agglomeration poly fuse device
TAIWAN SEMICONDUCTOR MFG50 citations96
US6436738B1Aug 20, 2002
Silicide agglomeration poly fuse device
TAIWAN SEMICONDUCTOR MFG45 citations96
US6891230B2May 10, 2005
Bipolar ESD protection structure
TAIWAN SEMICONDUCTOR MFG19 citations93
US6872987B2Mar 29, 2005
Silicon controlled rectifier ESD structures with trench isolation
TAIWAN SEMICONDUCTOR MFG18 citations93
US6737682B1May 18, 2004
High voltage tolerant and low voltage triggering floating-well silicon controlled rectifier on silicon-on-insulator for input or output
TAIWAN SEMICONDUCTOR MFG22 citations93
US6720622B1Apr 13, 2004
SCR-ESD structures with shallow trench isolation
TAIWAN SEMICONDUCTOR MFG28 citations93
US6642088B1Nov 4, 2003
Silicon-controlled rectifier structures on silicon-on insulator with shallow trench isolation
TAIWAN SEMICONDUCTOR MFG42 citations93
US6605493B1Aug 12, 2003
Silicon controlled rectifier ESD structures with trench isolation
TAIWAN SEMICONDUCTOR MFG46 citations93
US6537868B1Mar 25, 2003
Method for forming novel low leakage current cascaded diode structure
TAIWAN SEMICONDUCTOR MFG24 citations93
US6476422B1Nov 5, 2002
Electrostatic discharge protection circuit with silicon controlled rectifier characteristics
TAIWAN SEMICONDUCTOR MFG22 citations93
US6472286B1Oct 29, 2002
Bipolar ESD protection structure
TAIWAN SEMICONDUCTOR MFG31 citations93
US6466423B1Oct 15, 2002
Electrostatic discharge protection device for mixed voltage application
TAIWAN SEMICONDUCTOR MFG23 citations93
US6444503B1Sep 3, 2002
Fabricating electrical metal fuses without additional masking
TAIWAN SEMICONDUCTOR MFG21 citations93
US6433979B1Aug 13, 2002
Electrostatic discharge protection device using semiconductor controlled rectifier
TAIWAN SEMICONDUCTOR MFG44 citations93
US6867103B1Mar 15, 2005
Method of fabricating an ESD device on SOI
TAIWAN SEMICONDUCTOR MFG19 citations84
US6815821B2Nov 9, 2004
Method of fabricating seal-ring structure with ESD protection
TAIWAN SEMICONDUCTOR MFG16 citations84
US6762439B1Jul 13, 2004
Diode for power protection
TAIWAN SEMICONDUCTOR MFG14 citations84
US6756642B2Jun 29, 2004
Integrated circuit having improved ESD protection
TAIWAN SEMICONDUCTOR MFG15 citations84
WINDBOND ELECTRONICS CORP
2 patentsTAIWAN SEMICONDCUTOR MFG CO LT
1 patentSEMICONDUCTOR MFG INT CORP
1 patentShowing the top 50 of 91 patents by PatentIndex Score.