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Inventor
LEE BAE KI
KR
2 patents
Patents
2 patents
US6133745A
Oct 17, 2000
Socket type module test apparatus and socket for the same
SAMSUNG ELECTRONICS CO LTD
31 citations
86
US9134365B2
Sep 15, 2015
System for testing semiconductor modules
SAMSUNG ELECTRONICS CO LTD
0 citations
36