Inventor
SENGUPTA SANJAY
US5 patents
⚠️ This page may combine multiple inventors who share the name “SENGUPTA SANJAY”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
4 patentsUS6510398B1Jan 21, 2003
Constrained signature-based test
INTEL CORP68 citations92
US7096397B2Aug 22, 2006
Dft technique for avoiding contention/conflict in logic built-in self-test
INTEL CORP12 citations80
US6237121B1May 22, 2001
Method and apparatus for performing register transfer level scan selection
INTEL CORP4 citations60
US7036063B2Apr 25, 2006
Generalized fault model for defects and circuit marginalities
INTEL CORP1 citations50