Inventor

FOUQUET CHRISTOPHE

US6 patents

⚠️ This page may combine multiple inventors who share the name “FOUQUET CHRISTOPHE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KLA TENCOR CORP

1 patent

US7904845B2Mar 8, 2011

Determining locations on a wafer to be reviewed during defect review

KLA TENCOR CORP50 citations92

KLA TENCOR TECH CORP

1 patent

US7747062B2Jun 29, 2010

Methods, defect review tools, and systems for locating a defect in a defect review process

KLA TENCOR TECH CORP32 citations89

SCHLUMBERGER RESOURCE MAN SERV

1 patent

US7219069B2May 15, 2007

System and method for creating dynamic facility models with data normalization as attributes change over time

SCHLUMBERGER RESOURCE MAN SERV18 citations81

FOUQUET CHRISTOPHE

1 patent

US9710903B2Jul 18, 2017

System and method for detecting design and process defects on a wafer using process monitoring features

FOUQUET CHRISTOPHE10 citations77

ABBOTT GORDON

1 patent

US8175373B2May 8, 2012

Use of design information and defect image information in defect classification

ABBOTT GORDON16 citations76

ITRON INC

1 patent

US9082291B2Jul 14, 2015

Virtual metering with partitioned metrology

ITRON INC2 citations59