Inventor

KANG JOONG WUK

KR2 patents

⚠️ This page may combine multiple inventors who share the name “KANG JOONG WUK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

1 patent

US7514949B2Apr 7, 2009

Testing method detecting localized failure on a semiconductor wafer

SAMSUNG ELECTRONICS CO LTD7 citations67

BASE KOREA INFORMATION COMMUNICATION CO LTD

1 patent

US9773287B1Sep 26, 2017

Weapon management system using police officer black-box, method and apparatus for police officer black-box

BASE KOREA INFORMATION COMMUNICATION CO LTD3 citations57