Inventor

KONO TAKASHI

JP174 patents

⚠️ This page may combine multiple inventors who share the name “KONO TAKASHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KONO TAKASHI

MITSUBISHI ELECTRIC CORP

Clock synchronous semiconductor memory device allowing testing by low speed tester

Dynamic semiconductor memory device with reduced current consumption in sensing operation

Semiconductor device having an internal voltage generating circuit

Semiconductor memory device capable of accurate control of internally produced power supply potential

Internal high voltage generation circuit capable of stably generating internal high voltage and circuit element therefor

Semiconductor memory device capable of stable sensing operation

Internal high voltage generation circuit capable of stably generating internal high voltage and circuit element therefor

Semiconductor memory device with improved setup time and hold time

Internal voltage generating circuit

Semiconductor memory device capable of performing stable sensing operation even under low power supply voltage environment

Semiconductor device capable of stably generating internal voltage with low supply voltage

Method of fabricating semiconductor device with a fuse portion

Semiconductor memory device employing ferroelectric memory cell, attaining low power consumption while preventing deterioration of ferroelectric

Semiconductor memory device having hierarchical boosted power-line scheme

Semiconductor memory device capable of switching reference voltage for generating intermediate voltage

Test circuit for a semiconductor memory device and method for burn-in test

Semiconductor integrated circuit device having internal supply voltage generating circuit

Circuit for adjusting a voltage level in a semiconductor device

RENESAS TECH CORP

Semiconductor memory device having multi-bit testing function

Semiconductor memory device with clock generating circuit

Semiconductor memory device allowing accurate burn-in test

Semiconductor device including voltage conversion circuit having temperature dependency

Semiconductor memory device with internal clock generation circuit

Internal high voltage generation circuit capable of stably generating internal high voltage and circuit element therefor

Semiconductor memory device having configuration for selecting desired delay locked loop clock

Semiconductor device capable of shortening test time and suppressing increase in chip area, and method of manufacturing semiconductor integrated circuit device

Semiconductor memory device having a sub-amplifier configuration

Semiconductor memory device including clock generation circuit

WESTERN DIGITAL TECH INC

Electronic device enclosure

Storage drive

Storage drive

Storage drive

Storage drive

Storage drive

Data storage device

NEC TOKIN CORP

Chip capacitor and method of manufacturing same

Method for fabricating chip type solid electrolytic capacitor and apparatus for performing the same method

Chip type capacitor, method for preparing the same and anode terminal used for preparing the same

Nb solid electrolytic capacitor and method for preparing the same

Solid electrolytic capacitor

HITACHI LTD

Recording disk apparatus and rotational supporting structure therefor having improved lubrication arrangement

Recording disk apparatus and rotational supporting structure therefor, having a magnetic lubricant seal which is inclined

Bearing device and spindle motor provided with the bearing device

Oil retaining bearing unit and motor having oil retaining bearing unit

NEC CORP

Wire bonding apparatus

Surface-mounting structure and method of electronic devices

Method of manufacturing solid electrolytic capacitor

KONO TAKASHI

Image processing apparatus, image processing method, and computer-readable recording medium

DENSO CORP

Manufacturing apparatus of a corrugated fin and method of manufacturing the same

HIROTA MASASHI

Image processing apparatus, image processing method, and computer readable recording medium