Inventor

FU JINXIN

US43 patents

⚠️ This page may combine multiple inventors who share the name “FU JINXIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FU JINXIN

APPLIED MATERIALS INC

Imaging system and method of creating composite images

Full-field metrology tool for waveguide combiners and meta-surfaces

Method of forming gratings

Methods and apparatus for waveguide metrology

Measurement system and grating pattern array

Lithography method to form structures with slanted angle

Dielectric filled nanostructured silica substrate for flat optical devices

Ion implantation to modify glass locally for optical devices

Method of measuring efficiency for optical devices

In-line metrology systems, apparatus, and methods for optical devices

In-line metrology systems, apparatus, and methods for optical devices

Interference in-sensitive Littrow system for optical device structure measurement

Imaging system and method of creating composite images

See-through metrology systems, apparatus, and methods for optical devices

Interference in-sensitive Littrow system for optical device structure measurement

Ion implantation to modify glass locally for optical devices

See-through metrology systems, apparatus, and methods for optical devices

Method for creating a dielectric filled nanostructured silica substrate for flat optical devices

Methods of forming devices on a substrate

Waveguide combiners having arrangements for image uniformity

Lithography method to form structures with slanted angle

Die system and method of comparing alignment vectors

Method to measure light loss of optical films and optical substrates

Method to measure light loss of optical films and optical substrates

PVD titanium dioxide formation using sputter etch to halt onset of crystalinity in thick films

Ultra-wide angle lens systems with external pupil

Method to determine line angle and rotation of multiple patterning

Reconfigurable optical interconnects for co-packaged devices including photonic integrated circuits

High bandwidth density optical interfaces for co-packaged devices including photonic integrated circuits

Wetting layers for optical device enhancement

Optical device with elements having outwardly-curved opposing leading edges spaced according to a duty cycle, pitch, and critical dimension

Methods for high-resolution, stable measurement of pitch and orientation in optical gratings

Optical resolution measurement method for optical devices

Illumination system for AR metrology tool

PVD directional deposition for encapsulation

Optical device metrology systems and related methods

Measurement system and a method of diffracting light

Gap fill of imprinted structure with spin coated high refractive index material for optical components

Imaging system and method of manufacturing a metalens array

Optical device improvement

Methods of geometry parameters measurement for optical gratings

Edge inspection system for inspection of optical devices

NOKIA TECHNOLOGIES OY

Movement track generation method and apparatus