Inventor
WANG SHIH-CHE
TW18 patents
⚠️ This page may combine multiple inventors who share the name “WANG SHIH-CHE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
11 patentsUS10558120B2Feb 11, 2020
System and method for supplying and dispensing bubble-free photolithography chemical solutions
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US12001132B2Jun 4, 2024
Protection layer on low thermal expansion material (LTEM) substrate of extreme ultraviolet (EUV) mask
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US12025917B2Jul 2, 2024
System and method for supplying and dispensing bubble-free photolithography chemical solutions
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11798800B2Oct 24, 2023
Method and apparatus for solvent recycling
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US12362179B2Jul 15, 2025
Method and apparatus for coating photo resist over a substrate
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US11955335B2Apr 9, 2024
Method and apparatus for coating photo resist over a substrate
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US11624985B2Apr 11, 2023
Methods of defect inspection
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US10795270B2Oct 6, 2020
Methods of defect inspection
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations58
US9817315B2Nov 14, 2017
System and method for supplying and dispensing bubble-free photolithography chemical solutions
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US11545361B2Jan 3, 2023
Method and apparatus for coating photo resist over a substrate
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations47
US10274818B2Apr 30, 2019
Lithography patterning with sub-resolution assistant patterns and off-axis illumination
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations47
TAIWAN SEMICONDUCTOR MFG
3 patentsUS7838173B2Nov 23, 2010
Structure design and fabrication on photomask for contact hole manufacturing process window enhancement
TAIWAN SEMICONDUCTOR MFG3 citations62
US7338909B2Mar 4, 2008
Micro-etching method to replicate alignment marks for semiconductor wafer photolithography
TAIWAN SEMICONDUCTOR MFG5 citations58
US9280041B2Mar 8, 2016
Cross quadrupole double lithography method using two complementary apertures
TAIWAN SEMICONDUCTOR MFG0 citations52