Inventor

Zamek Sharon

US3 patents

Patents

3 patents

US10764527B2Sep 1, 2020

Dual-column-parallel CCD sensor and inspection systems using a sensor

KLA TENCOR CORP3 citations71

US10778925B2Sep 15, 2020

Multiple column per channel CCD sensor architecture for inspection and metrology

KLA TENCOR CORP1 citations61

US10313622B2Jun 4, 2019

Dual-column-parallel CCD sensor and inspection systems using a sensor

KLA TENCOR CORP1 citations61