P

Inventor

JANG JI-EUN

KR77 patents
⚠️ This page may combine multiple inventors who share the name “JANG JI-EUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HYNIX SEMICONDUCTOR INC

26 patents
US7853842B2Dec 14, 2010

Semiconductor memory device with ZQ calibration

HYNIX SEMICONDUCTOR INC21 citations93
US6949971B2Sep 27, 2005

Reference voltage generating circuit for outputting multi-level reference voltage using fuse trimming

HYNIX SEMICONDUCTOR INC31 citations93
US7818526B2Oct 19, 2010

Semiconductor memory device having test mode for data access time

HYNIX SEMICONDUCTOR INC10 citations84
US7676686B2Mar 9, 2010

Delay locked loop circuit and synchronous memory device including the same

HYNIX SEMICONDUCTOR INC13 citations84
US7672191B2Mar 2, 2010

Data output control circuit

HYNIX SEMICONDUCTOR INC13 citations84
US7616032B2Nov 10, 2009

Internal voltage initializing circuit for use in semiconductor memory device and driving method thereof

HYNIX SEMICONDUCTOR INC13 citations84
US7420873B2Sep 2, 2008

Simplified power-down mode control circuit utilizing active mode operation control signals

HYNIX SEMICONDUCTOR INC10 citations84
US7362167B2Apr 22, 2008

Voltage generator

HYNIX SEMICONDUCTOR INC10 citations84
US7362631B2Apr 22, 2008

Semiconductor memory device capable of controlling drivability of overdriver

HYNIX SEMICONDUCTOR INC15 citations84
US7193906B2Mar 20, 2007

Voltage regulating circuit and method of regulating voltage

HYNIX SEMICONDUCTOR INC11 citations84
US7106112B2Sep 12, 2006

Apparatus for generating power-up signal

HYNIX SEMICONDUCTOR INC14 citations84
US7107500B2Sep 12, 2006

Test mode circuit of semiconductor memory device

HYNIX SEMICONDUCTOR INC12 citations84
US7986180B2Jul 26, 2011

Semiconductor memory device having internal voltage generator and method for driving the same

HYNIX SEMICONDUCTOR INC6 citations74
US7826304B2Nov 2, 2010

Simplified power-down mode control circuit utilizing active mode operation control signals

HYNIX SEMICONDUCTOR INC6 citations74
US7549092B2Jun 16, 2009

Output controller with test unit

HYNIX SEMICONDUCTOR INC7 citations74
US7449965B2Nov 11, 2008

Self refresh oscillator and oscillation signal generation method of the same

HYNIX SEMICONDUCTOR INC6 citations74
US7825683B2Nov 2, 2010

On die termination device and semiconductor memory device including the same

HYNIX SEMICONDUCTOR INC2 citations63
US7737712B2Jun 15, 2010

Probe-testing device and method of semiconductor device

HYNIX SEMICONDUCTOR INC4 citations63
US7706196B2Apr 27, 2010

Semiconductor memory device

HYNIX SEMICONDUCTOR INC6 citations63
US7660171B2Feb 9, 2010

Semiconductor memory device and method for driving the same

HYNIX SEMICONDUCTOR INC6 citations63
US7576596B2Aug 18, 2009

Internal voltage generator of semiconductor device

HYNIX SEMICONDUCTOR INC4 citations63
US7505358B2Mar 17, 2009

Synchronous semiconductor memory device

HYNIX SEMICONDUCTOR INC2 citations63
US7434120B2Oct 7, 2008

Test mode control circuit

HYNIX SEMICONDUCTOR INC3 citations63
US6980040B2Dec 27, 2005

Delay adjusting apparatus providing different delay times by producing a plurality of delay control signals

HYNIX SEMICONDUCTOR INC5 citations63
US6819134B2Nov 16, 2004

Decoding circuit for wafer burn-in test

HYNIX SEMICONDUCTOR INC4 citations63
US8036053B2Oct 11, 2011

Semiconductor memory device capable of suppressing a coupling effect of a test-disable transmission line

HYNIX SEMICONDUCTOR INC2 citations61

SAMSUNG DISPLAY CO LTD

6 patents

ORACLE INT CORP

4 patents

SK HYNIX INC

3 patents

HYUNDAI ELECTRONICS IND

3 patents

HYUNDAI MOTOR CO LTD

2 patents

CHEN BO-WEI

1 patent

KIM BO YEUN

1 patent

KIM HYOUNG-WOOK

1 patent

JEONG YONG-JU

1 patent

JANG JI-EUN

1 patent

SAMSUNG ELECTRONICS CO LTD

1 patent

Showing the top 50 of 77 patents by PatentIndex Score.