P

Inventor

LIU HSIANG-WEI

TW41 patents
⚠️ This page may combine multiple inventors who share the name “LIU HSIANG-WEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

35 patents
US10269715B2Apr 23, 2019

Split rail structures located in adjacent metal layers

TAIWAN SEMICONDUCTOR MFG CO LTD29 citations94
US10020261B2Jul 10, 2018

Split rail structures located in adjacent metal layers

TAIWAN SEMICONDUCTOR MFG CO LTD31 citations94
US11729969B1Aug 15, 2023

Semiconductor device and method of operating the same

TAIWAN SEMICONDUCTOR MFG CO LTD5 citations86
US10290580B2May 14, 2019

Hybrid copper structure for advance interconnect usage

TAIWAN SEMICONDUCTOR MFG CO LTD7 citations84
US9837354B2Dec 5, 2017

Hybrid copper structure for advance interconnect usage

TAIWAN SEMICONDUCTOR MFG CO LTD7 citations84
US9607881B2Mar 28, 2017

Insulator void aspect ratio tuning by selective deposition

TAIWAN SEMICONDUCTOR MFG CO LTD13 citations84
US11302570B2Apr 12, 2022

Interconnect structure and method for forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US10957580B2Mar 23, 2021

Metal routing with flexible space formed using self-aligned spacer patterning

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10930551B2Feb 23, 2021

Methods for fabricating a low-resistance interconnect

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10818597B2Oct 27, 2020

Hybrid copper structure for advance interconnect usage

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10734275B2Aug 4, 2020

Metal routing with flexible space formed using self-aligned spacer patterning

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10534273B2Jan 14, 2020

Multi-metal fill with self-aligned patterning and dielectric with voids

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10529617B2Jan 7, 2020

Metal routing with flexible space formed using self-aligned spacer patterning

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9583434B2Feb 28, 2017

Metal line structure and method

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US12278143B2Apr 15, 2025

Method of providing a workpiece including low resistance interconnect low-resistance interconnect

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11769695B2Sep 26, 2023

Semiconductor structure including low-resistance interconnect and integrated circuit device having the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12058852B2Aug 6, 2024

Semiconductor device and method of operating the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12051646B2Jul 30, 2024

Metal line structure and method

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12002709B2Jun 4, 2024

Interconnect structure and manufacturing method for the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11860550B2Jan 2, 2024

Multi-metal fill with self-aligned patterning and dielectric with voids

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11422475B2Aug 23, 2022

Multi-metal fill with self-aligned patterning and dielectric with voids

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11107725B2Aug 31, 2021

Interconnect structure and manufacturing method for the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11101216B2Aug 24, 2021

Metal line structure and method

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10276396B2Apr 30, 2019

Method for forming semiconductor device with damascene structure

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US12543546B2Feb 3, 2026

Package structure and method for fabricating the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12493731B2Dec 9, 2025

Multiple pattern metal fuse device, layout, and method

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12324149B2Jun 3, 2025

Metal fuse structure by via landing

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10784151B2Sep 22, 2020

Interconnect structure and manufacturing method for the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10522469B2Dec 31, 2019

Split rail structures located in adjacent metal layers

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9595471B2Mar 14, 2017

Conductive element structure and method

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9425089B2Aug 23, 2016

Conductive element structure and method

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations52
US12380957B2Aug 5, 2025

Memory device, layout, and method

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10490500B2Nov 26, 2019

Metal line structure and method

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10535560B2Jan 14, 2020

Interconnection structure of semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations42
US10163690B2Dec 25, 2018

2-D interconnections for integrated circuits

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations42

QUANTA COMP INC

2 patents

GLOBAL UNICHIP CORP

2 patents

LIU HSIANG-WEI

1 patent

CHUANG WEN-HSIEN

1 patent