Inventor · disambiguated record

Jeffrey Frank Kutner

Also filed as: KUTNER JEFFREY FRANK

1 granted patent·26 citations·filing 2003–2003

43Inventor score

Technology areasG01R

Files withIBM1

Top patents by PatentIndex Score

1 record

0180US6911836B2Apparatus for functional and stress testing of exposed chip land grid array devicesIBM·Filed 2003·Granted Jun 28, 2005·26 cites·18 claims

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →