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Inventor
YOSHIMATSU TAKANORI
JP
2 patents
Patents
2 patents
US6985395B2
Jan 10, 2006
Semiconductor memory device and method of testing the device
TOSHIBA KK
11 citations
80
US7660257B2
Feb 9, 2010
Semiconductor device and test method of semiconductor device
TOSHIBA KK
0 citations
41