Inventor

O'DELL JEFFREY L

US2 patents

⚠️ This page may combine multiple inventors who share the name “O'DELL JEFFREY L”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

RUDOLPH TECH INC

1 patent

US9464992B2Oct 11, 2016

Automated wafer defect inspection system and a process of performing such inspection

RUDOLPH TECH INC6 citations81

O'DELL JEFFREY L

1 patent

US9337071B2May 10, 2016

Automated wafer defect inspection system and a process of performing such inspection

O'DELL JEFFREY L1 citations54