Inventor
MILLER JR JAMES E
US24 patents
⚠️ This page may combine multiple inventors who share the name “MILLER JR JAMES E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
20 patentsUS6069506AMay 30, 2000
Method and apparatus for improving the performance of digital delay locked loop circuits
MICRON TECHNOLOGY INC175 citations99
US6316976B1Nov 13, 2001
Method and apparatus for improving the performance of digital delay locked loop circuits
MICRON TECHNOLOGY INC69 citations96
US6137334AOct 24, 2000
Logic circuit delay stage and delay line utilizing same
MICRON TECHNOLOGY INC53 citations96
US6137325AOct 24, 2000
Device and methods in a delay locked loop for generating quadrature and other off-phase clocks with improved resolution
MICRON TECHNOLOGY INC65 citations96
US6392458B1May 21, 2002
Method and apparatus for digital delay locked loop circuits
MICRON TECHNOLOGY INC29 citations92
US6359482B1Mar 19, 2002
Method and apparatus for digital delay locked loop circuits
MICRON TECHNOLOGY INC23 citations92
US6300668B2Oct 9, 2001
High resistance integrated circuit resistor
MICRON TECHNOLOGY INC19 citations92
US5944845AAug 31, 1999
Circuit and method to prevent inadvertent test mode entry
MICRON TECHNOLOGY INC23 citations92
US5808897ASep 15, 1998
Integrated circuit device having interchangeable terminal connection
MICRON TECHNOLOGY INC30 citations92
US5734661AMar 31, 1998
Method and apparatus for providing external access to internal integrated circuit test circuits
MICRON TECHNOLOGY INC51 citations92
US5936974AAug 10, 1999
Circuit and method for testing an integrated circuit
MICRON TECHNOLOGY INC22 citations90
US5787096AJul 28, 1998
Circuit and method for testing an integrated circuit
MICRON TECHNOLOGY INC26 citations90
US6138258AOct 24, 2000
Circuit and method to prevent inadvertent test mode entry
MICRON TECHNOLOGY INC10 citations82
US5679593AOct 21, 1997
Method of fabricating a high resistance integrated circuit resistor
MICRON TECHNOLOGY INC14 citations82
US7376874B2May 20, 2008
Method of controlling a test mode of a circuit
MICRON TECHNOLOGY INC3 citations74
US6760875B2Jul 6, 2004
Method of testing a circuit using an output vector
MICRON TECHNOLOGY INC3 citations74
US6591386B2Jul 8, 2003
Method to prevent inadvertent test mode entry
MICRON TECHNOLOGY INC7 citations74
US6421800B1Jul 16, 2002
Circuit and method to prevent inadvertent test mode entry
MICRON TECHNOLOGY INC7 citations74
US6289479B1Sep 11, 2001
Circuit to prevent inadvertent test mode entry
MICRON TECHNOLOGY INC4 citations74
US5990538ANov 23, 1999
High resistivity integrated circuit resistor
MICRON TECHNOLOGY INC4 citations63