Inventor
SCHLEYEN RAN
IL8 patents
⚠️ This page may combine multiple inventors who share the name “SCHLEYEN RAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS ISRAEL LTD
6 patentsUS11379972B2Jul 5, 2022
Detecting defects in semiconductor specimens using weak labeling
APPLIED MATERIALS ISRAEL LTD5 citations70
US11449711B2Sep 20, 2022
Machine learning-based defect detection of a specimen
APPLIED MATERIALS ISRAEL LTD2 citations66
US11151710B1Oct 19, 2021
Automatic selection of algorithmic modules for examination of a specimen
APPLIED MATERIALS ISRAEL LTD6 citations66
US11790515B2Oct 17, 2023
Detecting defects in semiconductor specimens using weak labeling
APPLIED MATERIALS ISRAEL LTD0 citations59
US9490101B2Nov 8, 2016
System and method for scanning an object
APPLIED MATERIALS ISRAEL LTD1 citations49
US10340116B1Jul 2, 2019
Imaging an area that includes an upper surface and a hole
APPLIED MATERIALS ISRAEL LTD0 citations36