P

Inventor

CHOI KI-HWAN

KR41 patents
⚠️ This page may combine multiple inventors who share the name “CHOI KI-HWAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

32 patents
US10034630B2Jul 31, 2018

Apparatus and method to train autonomous driving model, and autonomous driving apparatus

SAMSUNG ELECTRONICS CO LTD64 citations97
US6233198B1May 15, 2001

High density flash memory device with improved row decoding structure

SAMSUNG ELECTRONICS CO LTD61 citations96
US6137729AOct 24, 2000

Method for erasing memory cells in a flash memory device

SAMSUNG ELECTRONICS CO LTD64 citations96
US5986947ANov 16, 1999

Charge pump circuits having floating wells

SAMSUNG ELECTRONICS CO LTD64 citations96
US7778084B2Aug 17, 2010

Non-volatile memory devices and operating methods thereof

SAMSUNG ELECTRONICS CO LTD49 citations94
US6407944B1Jun 18, 2002

Method for protecting an over-erasure of redundant memory cells during test for high-density nonvolatile memory semiconductor devices

SAMSUNG ELECTRONICS CO LTD17 citations93
US6249461B1Jun 19, 2001

Flash memory device with a status read operation

SAMSUNG ELECTRONICS CO LTD35 citations93
US6222772B1Apr 24, 2001

Methods of performing sector erase operations on non-volatile semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD27 citations93
US6914827B2Jul 5, 2005

Flash memory device capable of preventing an over-erase of flash memory cells and erase method thereof

SAMSUNG ELECTRONICS CO LTD25 citations92
US6577540B2Jun 10, 2003

Flash memory device capable of preventing an over-erase of flash memory cells and erase method thereof

SAMSUNG ELECTRONICS CO LTD24 citations92
US6314027B1Nov 6, 2001

Flash memory device capable of preventing an over-erasure of flash memory cells and erase method thereof

SAMSUNG ELECTRONICS CO LTD31 citations92
US7489558B2Feb 10, 2009

Program method of flash memory capable of compensating read margin reduced due to charge loss

SAMSUNG ELECTRONICS CO LTD12 citations84
US7366020B2Apr 29, 2008

Flash memory device capable of preventing an overerase of flash memory cells and erase method thereof

SAMSUNG ELECTRONICS CO LTD18 citations84
US6442071B2Aug 27, 2002

Non-volatile semiconductor memory device with improved erase algorithm

SAMSUNG ELECTRONICS CO LTD18 citations84
US10489684B2Nov 26, 2019

Image processing apparatus and method based on deep learning and neural network learning

SAMSUNG ELECTRONICS CO LTD8 citations83
US8385120B2Feb 26, 2013

Method of programming a nonvolatile memory device

SAMSUNG ELECTRONICS CO LTD9 citations82
US10133938B2Nov 20, 2018

Apparatus and method for object recognition and for training object recognition model

SAMSUNG ELECTRONICS CO LTD10 citations81
US6492832B2Dec 10, 2002

Methods for testing a group of semiconductor devices simultaneously, and devices amenable to such methods of testing

SAMSUNG ELECTRONICS CO LTD9 citations74
US6483747B2Nov 19, 2002

Method for protecting an over-erasure of redundant memory cells during test for high-density nonvolatile memory semiconductor devices

SAMSUNG ELECTRONICS CO LTD6 citations74
US6151250ANov 21, 2000

Flash memory device and verify method thereof

SAMSUNG ELECTRONICS CO LTD11 citations74
US6064596AMay 16, 2000

Nonvolatile integrated circuit memory devices and methods of operating same

SAMSUNG ELECTRONICS CO LTD8 citations74
US9524782B2Dec 20, 2016

Nonvolatile memory device and method of writing data in nonvolatile memory device

SAMSUNG ELECTRONICS CO LTD4 citations73
US11341375B2May 24, 2022

Image processing apparatus and method based on deep learning and neural network learning

SAMSUNG ELECTRONICS CO LTD2 citations72
US7760551B2Jul 20, 2010

Method of programming nonvolatile memory device

SAMSUNG ELECTRONICS CO LTD4 citations63
US7190624B2Mar 13, 2007

Flash memory device capable of preventing an over-erase of flash memory cells and erase method thereof

SAMSUNG ELECTRONICS CO LTD5 citations63
US6483759B1Nov 19, 2002

Methods for testing a group of semiconductor devices simultaneously, and devices amenable to such methods of testing

SAMSUNG ELECTRONICS CO LTD2 citations63
US8018781B2Sep 13, 2011

Method of operating nonvolatile memory device

SAMSUNG ELECTRONICS CO LTD0 citations52
US7554386B2Jun 30, 2009

High voltage generation circuit and method for reducing peak current and power noise for a semiconductor memory device

SAMSUNG ELECTRONICS CO LTD1 citations52
US5940326AAug 17, 1999

Method for erasing data stored in a nonvolatile memory device

SAMSUNG ELECTRONICS CO LTD1 citations52
US10791979B2Oct 6, 2020

Apparatus and method to train autonomous driving model, and autonomous driving apparatus

SAMSUNG ELECTRONICS CO LTD0 citations51
US10681270B2Jun 9, 2020

Electronic device for creating panoramic image or motion picture and method for the same

SAMSUNG ELECTRONICS CO LTD0 citations48
US10339675B2Jul 2, 2019

Tomography apparatus and method for reconstructing tomography image thereof

SAMSUNG ELECTRONICS CO LTD0 citations41

SAMSUNG ELECTRONICS CO INC

1 patent

CHOI KI HWAN

1 patent

SAMSUNG ELECTRONICS COT LTD

1 patent

LEE JI-SANG

1 patent

KIM HYUNG-GON

1 patent

YUN SUNG-WON

1 patent

KIM SI-HWAN

1 patent

LEE CHUNG-HYUN

1 patent

MOON SEUNG-HYUN

1 patent