Inventor
WOHLFAHRT JOERG
TW16 patents
⚠️ This page may combine multiple inventors who share the name “WOHLFAHRT JOERG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INFINEON TECHNOLOGIES AG
10 patentsUS7187602B2Mar 6, 2007
Reducing memory failures in integrated circuits
INFINEON TECHNOLOGIES AG16 citations84
US6639824B1Oct 28, 2003
Memory architecture
INFINEON TECHNOLOGIES AG13 citations84
US6800890B1Oct 5, 2004
Memory architecture with series grouped by cells
INFINEON TECHNOLOGIES AG14 citations83
US6999887B2Feb 14, 2006
Memory cell signal window testing apparatus
INFINEON TECHNOLOGIES AG10 citations73
US6826099B2Nov 30, 2004
2T2C signal margin test mode using a defined charge and discharge of BL and /BL
INFINEON TECHNOLOGIES AG12 citations73
US6731554B1May 4, 2004
2T2C signal margin test mode using resistive element
INFINEON TECHNOLOGIES AG7 citations73
US6731529B2May 4, 2004
Variable capacitances for memory cells within a cell group
INFINEON TECHNOLOGIES AG7 citations73
US6720598B1Apr 13, 2004
Series memory architecture
INFINEON TECHNOLOGIES AG9 citations73
US6903959B2Jun 7, 2005
Sensing of memory integrated circuits
INFINEON TECHNOLOGIES AG2 citations62
US6807084B1Oct 19, 2004
FeRAM memory device
INFINEON TECHNOLOGIES AG3 citations62
INFINEON TECHNOLOGIES RICHMOND
3 patentsUS6717431B2Apr 6, 2004
Method for semiconductor yield loss calculation
INFINEON TECHNOLOGIES RICHMOND20 citations85
US6553521B1Apr 22, 2003
Method for efficient analysis semiconductor failures
INFINEON TECHNOLOGIES RICHMOND15 citations78
US7003432B2Feb 21, 2006
Method of and system for analyzing cells of a memory device
INFINEON TECHNOLOGIES RICHMOND3 citations56