Inventor

PARKER KENNETH P

US40 patents

⚠️ This page may combine multiple inventors who share the name “PARKER KENNETH P”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

PARKER KENNETH P

AGILENT TECHNOLOGIES INC

Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry

Integrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitry

Test structure embedded in a shipping and handling cover for integrated circuit sockets and method for testing integrated circuit sockets and circuit assemblies utilizing same

Apparatus and method for electrolytic bare board testing

Method and apparatus for non-contact testing and diagnosing electrical paths through connectors on circuit assemblies

Methods and apparatus for testing continuity of electrical paths through connectors of circuit assemblies

Methods and apparatus for diagnosing defect locations in electrical paths of connectors of circuit assemblies

Mechanism and display for boundary-scan debugging information

Method and apparatus for engineering a testability interposer for testing sockets and connectors on printed circuit boards

Methods and apparatus for non-contact testing and diagnosing of inaccessible shorted connections

Method and apparatus for layout independent test point placement on a printed circuit board

Method and apparatus of boundary scan testing for AC-coupled differential data paths

Method and apparatus for a twisting fixture probe for probing test access point structures

Post-mission test method for checking the integrity of a boundary scan test

Methods and apparatus for characterizing board test coverage

Boundary-Scan methods and apparatus

Methods for predicting board test coverage

Development of automated digital libraries for in-circuit testing of printed curcuit boards

Method and apparatus for manufacturing and probing printed circuit board test access point structures

Method and apparatus for determining probing locations for a printed circuit board

Methods and apparatus for unpowered testing of open connections on power and ground nodes of circuit devices

Method for non-contact testing of fixed and inaccessible connections without using a sensor plate

Methods for testing continuity of electrical paths through connectors of circuit assemblies

Method and apparatus for manufacturing and probing test probe access structures on vias

Printed circuit board test access point structures and method for making the same

Method for non-contact testing of marginal integrated circuit connections

Methods and apparatus for characterizing board test coverage

Method and system for implicitly encoding preferred probing locations in a printed circuit board design for use in tester fixture build

Method and apparatus for a wobble fixture probe for probing test access point structures

Methods and apparatus for non-contact testing and diagnosing of open connections on non-probed nodes

HEWLETT PACKARD CO

Enhanced interconnect testing through utilization of board topology data

Powered testing of mixed conventional/boundary-scan logic

Partitioned boundary-scan testing for the reduction of testing-induced damage

Powered testing of mixed conventional/boundary-scan logic

Circuit tester with coincident sequencing of independently compressed test data matrix segments

Testing series passive components without contacting the driven node

Powered testing of mixed conventional/boundary-scan logic

Powered testing of mixed conventional/boundary-scan logic

Boundary scan testing device

VERIGY IPCO

Methods and apparatus for minimizing current surges during integrated circuit testing