Inventor
KO KEI-YU
US24 patents
⚠️ This page may combine multiple inventors who share the name “KO KEI-YU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
22 patentsUS6117791ASep 12, 2000
Etchant with selectivity for doped silicon dioxide over undoped silicon dioxide and silicon nitride, processes which employ the etchant, and structures formed thereby
MICRON TECHNOLOGY INC41 citations96
US6849557B1Feb 1, 2005
Undoped silicon dioxide as etch stop for selective etch of doped silicon dioxide
MICRON TECHNOLOGY INC23 citations92
US6831019B1Dec 14, 2004
Plasma etching methods and methods of forming memory devices comprising a chalcogenide comprising layer received operably proximate conductive electrodes
MICRON TECHNOLOGY INC33 citations92
US6551940B1Apr 22, 2003
Undoped silicon dioxide as etch mask for patterning of doped silicon dioxide
MICRON TECHNOLOGY INC18 citations92
US6432833B1Aug 13, 2002
Method of forming a self aligned contact opening
MICRON TECHNOLOGY INC20 citations92
US6337285B1Jan 8, 2002
Self-aligned contact (SAC) etch with dual-chemistry process
MICRON TECHNOLOGY INC42 citations92
US6277758B1Aug 21, 2001
Method of etching doped silicon dioxide with selectivity to undoped silicon dioxide with a high density plasma etcher
MICRON TECHNOLOGY INC29 citations92
US6121671ASep 19, 2000
Semiconductor device having a substrate, an undoped silicon oxide structure, and an overlying doped silicon oxide structure with a side wall terminating at the undoped silicon oxide structure
MICRON TECHNOLOGY INC31 citations92
US6117788ASep 12, 2000
Semiconductor etching methods
MICRON TECHNOLOGY INC23 citations92
US7094700B2Aug 22, 2006
Plasma etching methods and methods of forming memory devices comprising a chalcogenide comprising layer received operably proximate conductive electrodes
MICRON TECHNOLOGY INC15 citations84
US6716766B2Apr 6, 2004
Process variation resistant self aligned contact etch
MICRON TECHNOLOGY INC14 citations84
US6458685B2Oct 1, 2002
Method of forming a self-aligned contact opening
MICRON TECHNOLOGY INC16 citations77
US6989108B2Jan 24, 2006
Etchant gas composition
MICRON TECHNOLOGY INC5 citations74
US6967408B1Nov 22, 2005
Gate stack structure
MICRON TECHNOLOGY INC8 citations74
US6479864B1Nov 12, 2002
Semiconductor structure having a plurality of gate stacks
MICRON TECHNOLOGY INC11 citations74
US7470628B2Dec 30, 2008
Etching methods
MICRON TECHNOLOGY INC1 citations63
US7273566B2Sep 25, 2007
Gas compositions
MICRON TECHNOLOGY INC1 citations63
US7173339B1Feb 6, 2007
Semiconductor device having a substrate an undoped silicon oxide structure and an overlaying doped silicon oxide structure with a sidewall terminating at the undoped silicon oxide structure
MICRON TECHNOLOGY INC6 citations63
US6875371B1Apr 5, 2005
Etchant with selectivity for doped silicon dioxide over undoped silicon dioxide and silicon nitride, processes which employ the etchant, and structures formed thereby
MICRON TECHNOLOGY INC5 citations63
US6537922B1Mar 25, 2003
Etchant with selectivity for doped silicon dioxide over undoped silicon dioxide and silicon nitride, processes which employ the etchant, and structures formed thereby
MICRON TECHNOLOGY INC1 citations63
US6444586B2Sep 3, 2002
Method of etching doped silicon dioxide with selectivity to undoped silicon dioxide with a high density plasma etcher
MICRON TECHNOLOGY INC4 citations63
US7319075B2Jan 15, 2008
Etchant with selectivity for doped silicon dioxide over undoped silicon dioxide and silicon nitride, processes which employ the etchant, and structures formed thereby
MICRON TECHNOLOGY INC0 citations52