P

Inventor

KO KEI-YU

US24 patents
⚠️ This page may combine multiple inventors who share the name “KO KEI-YU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

22 patents
US6117791ASep 12, 2000

Etchant with selectivity for doped silicon dioxide over undoped silicon dioxide and silicon nitride, processes which employ the etchant, and structures formed thereby

MICRON TECHNOLOGY INC41 citations96
US6849557B1Feb 1, 2005

Undoped silicon dioxide as etch stop for selective etch of doped silicon dioxide

MICRON TECHNOLOGY INC23 citations92
US6831019B1Dec 14, 2004

Plasma etching methods and methods of forming memory devices comprising a chalcogenide comprising layer received operably proximate conductive electrodes

MICRON TECHNOLOGY INC33 citations92
US6551940B1Apr 22, 2003

Undoped silicon dioxide as etch mask for patterning of doped silicon dioxide

MICRON TECHNOLOGY INC18 citations92
US6432833B1Aug 13, 2002

Method of forming a self aligned contact opening

MICRON TECHNOLOGY INC20 citations92
US6337285B1Jan 8, 2002

Self-aligned contact (SAC) etch with dual-chemistry process

MICRON TECHNOLOGY INC42 citations92
US6277758B1Aug 21, 2001

Method of etching doped silicon dioxide with selectivity to undoped silicon dioxide with a high density plasma etcher

MICRON TECHNOLOGY INC29 citations92
US6121671ASep 19, 2000

Semiconductor device having a substrate, an undoped silicon oxide structure, and an overlying doped silicon oxide structure with a side wall terminating at the undoped silicon oxide structure

MICRON TECHNOLOGY INC31 citations92
US6117788ASep 12, 2000

Semiconductor etching methods

MICRON TECHNOLOGY INC23 citations92
US7094700B2Aug 22, 2006

Plasma etching methods and methods of forming memory devices comprising a chalcogenide comprising layer received operably proximate conductive electrodes

MICRON TECHNOLOGY INC15 citations84
US6716766B2Apr 6, 2004

Process variation resistant self aligned contact etch

MICRON TECHNOLOGY INC14 citations84
US6458685B2Oct 1, 2002

Method of forming a self-aligned contact opening

MICRON TECHNOLOGY INC16 citations77
US6989108B2Jan 24, 2006

Etchant gas composition

MICRON TECHNOLOGY INC5 citations74
US6967408B1Nov 22, 2005

Gate stack structure

MICRON TECHNOLOGY INC8 citations74
US6479864B1Nov 12, 2002

Semiconductor structure having a plurality of gate stacks

MICRON TECHNOLOGY INC11 citations74
US7470628B2Dec 30, 2008

Etching methods

MICRON TECHNOLOGY INC1 citations63
US7273566B2Sep 25, 2007

Gas compositions

MICRON TECHNOLOGY INC1 citations63
US7173339B1Feb 6, 2007

Semiconductor device having a substrate an undoped silicon oxide structure and an overlaying doped silicon oxide structure with a sidewall terminating at the undoped silicon oxide structure

MICRON TECHNOLOGY INC6 citations63
US6875371B1Apr 5, 2005

Etchant with selectivity for doped silicon dioxide over undoped silicon dioxide and silicon nitride, processes which employ the etchant, and structures formed thereby

MICRON TECHNOLOGY INC5 citations63
US6537922B1Mar 25, 2003

Etchant with selectivity for doped silicon dioxide over undoped silicon dioxide and silicon nitride, processes which employ the etchant, and structures formed thereby

MICRON TECHNOLOGY INC1 citations63
US6444586B2Sep 3, 2002

Method of etching doped silicon dioxide with selectivity to undoped silicon dioxide with a high density plasma etcher

MICRON TECHNOLOGY INC4 citations63
US7319075B2Jan 15, 2008

Etchant with selectivity for doped silicon dioxide over undoped silicon dioxide and silicon nitride, processes which employ the etchant, and structures formed thereby

MICRON TECHNOLOGY INC0 citations52

EASTMAN KODAK CO

1 patent

APPLIED MATERIALS INC

1 patent