Inventor
UEDA TAKAFUMI
JP54 patents
⚠️ This page may combine multiple inventors who share the name “UEDA TAKAFUMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SHINETSU CHEMICAL CO
24 patentsUS7163778B2Jan 16, 2007
Anti-reflection film material and a substrate having an anti-reflection film and a method for forming a pattern
SHINETSU CHEMICAL CO28 citations93
US6440646B2Aug 27, 2002
Positive resist composition suitable for lift-off technique and pattern forming method
SHINETSU CHEMICAL CO21 citations92
US6210855B1Apr 3, 2001
Positive resist composition suitable for lift-off technique and pattern forming method
SHINETSU CHEMICAL CO35 citations92
US8759220B1Jun 24, 2014
Patterning process
SHINETSU CHEMICAL CO13 citations84
US8029974B2Oct 4, 2011
Metal oxide-containing film-forming composition, metal oxide-containing film-formed substrate, and patterning process
SHINETSU CHEMICAL CO19 citations84
US8026038B2Sep 27, 2011
Metal oxide-containing film-forming composition, metal oxide-containing film, metal oxide-containing film-bearing substrate, and patterning method
SHINETSU CHEMICAL CO19 citations84
US7910283B2Mar 22, 2011
Silicon-containing antireflective coating forming composition, silicon-containing antireflective coating, substrate processing intermediate, and substrate processing method
SHINETSU CHEMICAL CO8 citations84
US7855043B2Dec 21, 2010
Silicon-containing film-forming composition, silicon-containing film, silicon-containing film-bearing substrate, and patterning method
SHINETSU CHEMICAL CO10 citations84
US7678529B2Mar 16, 2010
Silicon-containing film forming composition, silicon-containing film serving as etching mask, substrate processing intermediate, and substrate processing method
SHINETSU CHEMICAL CO8 citations84
US7585613B2Sep 8, 2009
Antireflection film composition, substrate, and patterning process
SHINETSU CHEMICAL CO12 citations84
US7485690B2Feb 3, 2009
Sacrificial film-forming composition, patterning process, sacrificial film and removal method
SHINETSU CHEMICAL CO8 citations84
US7417104B2Aug 26, 2008
Porous film-forming composition, patterning process, and porous sacrificial film
SHINETSU CHEMICAL CO9 citations84
US6451496B2Sep 17, 2002
Heat-curable photosensitive compositions
SHINETSU CHEMICAL CO7 citations74
US8945820B2Feb 3, 2015
Silicon-containing resist underlayer film-forming composition and patterning process
SHINETSU CHEMICAL CO4 citations73
US8951711B2Feb 10, 2015
Patterning process and composition for forming silicon-containing film usable therefor
SHINETSU CHEMICAL CO3 citations63
US8715913B2May 6, 2014
Silicon-containing resist underlayer film-forming composition and patterning process
SHINETSU CHEMICAL CO2 citations63
US8343711B2Jan 1, 2013
Patterning process
SHINETSU CHEMICAL CO2 citations63
US7868407B2Jan 11, 2011
Substrate comprising a lower silicone resin film and an upper silicone resin film
SHINETSU CHEMICAL CO4 citations63
US7642043B2Jan 5, 2010
Rework process for photoresist film
SHINETSU CHEMICAL CO2 citations63
US7385021B2Jun 10, 2008
Sacrificial film-forming composition, patterning process, sacrificial film and removal method
SHINETSU CHEMICAL CO6 citations63
US9075309B2Jul 7, 2015
Silicon-containing surface modifier, resist underlayer film composition containing this, and patterning process
SHINETSU CHEMICAL CO2 citations62
US9627204B2Apr 18, 2017
Composition for forming a coating type BPSG film, substrate formed a film by said composition, and patterning process using said composition
SHINETSU CHEMICAL CO1 citations52
US9176382B2Nov 3, 2015
Composition for forming titanium-containing resist underlayer film and patterning process
SHINETSU CHEMICAL CO0 citations52
US9005883B2Apr 14, 2015
Patterning process
SHINETSU CHEMICAL CO0 citations42
OGIHARA TSUTOMU
9 patentsUS8951917B2Feb 10, 2015
Composition for forming resist underlayer film and patterning process using the same
OGIHARA TSUTOMU16 citations84
US8852844B2Oct 7, 2014
Composition for forming silicon-containing film, silicon-containing film-formed substrate and patterning process
OGIHARA TSUTOMU18 citations84
US8835102B2Sep 16, 2014
Patterning process and composition for forming silicon-containing film usable therefor
OGIHARA TSUTOMU9 citations84
US8501386B2Aug 6, 2013
Silicon-containing film-forming composition, silicon-containing film-formed substrate, and patterning process
OGIHARA TSUTOMU14 citations84
US8329376B2Dec 11, 2012
Silicon-containing film-forming composition, silicon-containing film, silicon-containing film-bearing substrate, and patterning method
OGIHARA TSUTOMU17 citations84
US8932953B2Jan 13, 2015
Composition for forming a silicon-containing resist underlayer film and patterning process using the same
OGIHARA TSUTOMU6 citations72
US8859189B2Oct 14, 2014
Patterning process
OGIHARA TSUTOMU3 citations62
US8697330B2Apr 15, 2014
Composition for forming a silicon-containing antireflection film, substrate having the silicon-containing antireflection film from the composition and patterning process using the same
OGIHARA TSUTOMU1 citations52
US8652267B2Feb 18, 2014
Coated-type silicon-containing film stripping process
OGIHARA TSUTOMU0 citations51
IHI CORP
9 patentsUS10309248B2Jun 4, 2019
Variable geometry system turbocharger
IHI CORP3 citations71
US11572823B2Feb 7, 2023
Variable capacity turbocharger
IHI CORP2 citations70
US10907496B2Feb 2, 2021
Turbocharger
IHI CORP5 citations69
US10895166B2Jan 19, 2021
Turbocharger
IHI CORP2 citations69
US10030576B2Jul 24, 2018
Variable geometry system turbocharger
IHI CORP4 citations68
US11913373B2Feb 27, 2024
Variable capacity turbocharger
IHI CORP0 citations60
US12025012B2Jul 2, 2024
Variable capacity turbocharger
IHI CORP1 citations55
US11162381B2Nov 2, 2021
Turbocharger
IHI CORP0 citations55
US10280836B2May 7, 2019
Variable nozzle unit and variable geometry system turbocharger
IHI CORP0 citations41
IBM
2 patentsUS7541134B2Jun 2, 2009
Antireflective film-forming composition, method for manufacturing the same, and antireflective film and pattern formation method using the same
IBM34 citations93
US8999625B2Apr 7, 2015
Silicon-containing antireflective coatings including non-polymeric silsesquioxanes
IBM8 citations84
DAICEL POLYMER LTD
2 patentsSHIN ETSU CHEMICALS CO LTD
1 patentSHIN ESTU CHEMICAL CO LTD
1 patentISHIHARA SANGYO KAISHA
1 patentMITSUBISHI ELECTRIC CORP
1 patentShowing the top 50 of 54 patents by PatentIndex Score.