Inventor
HONG SUNGKWON C
US28 patents
⚠️ This page may combine multiple inventors who share the name “HONG SUNGKWON C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
14 patentsUS7119322B2Oct 10, 2006
CMOS image sensor having pinned diode floating diffusion region
MICRON TECHNOLOGY INC51 citations96
US7446807B2Nov 4, 2008
Imager pixel with capacitance for boosting reset voltage
MICRON TECHNOLOGY INC31 citations92
US7238544B2Jul 3, 2007
Imaging with gate controlled charge storage
MICRON TECHNOLOGY INC13 citations92
US7153719B2Dec 26, 2006
Method of fabricating a storage gate pixel design
MICRON TECHNOLOGY INC21 citations92
US7115923B2Oct 3, 2006
Imaging with gate controlled charge storage
MICRON TECHNOLOGY INC35 citations92
US7115855B2Oct 3, 2006
Image sensor having pinned floating diffusion diode
MICRON TECHNOLOGY INC29 citations92
US7078746B2Jul 18, 2006
Image sensor with floating diffusion gate capacitor
MICRON TECHNOLOGY INC27 citations92
US6900507B1May 31, 2005
Apparatus with silicide on conductive structures
MICRON TECHNOLOGY INC25 citations92
US7238977B2Jul 3, 2007
Wide dynamic range sensor having a pinned diode with multiple pinned voltages
MICRON TECHNOLOGY INC20 citations91
US7012000B2Mar 14, 2006
Methods of forming silicide on conductive structures
MICRON TECHNOLOGY INC7 citations74
US7344937B2Mar 18, 2008
Methods and apparatus with silicide on conductive structures
MICRON TECHNOLOGY INC4 citations63
US7279672B2Oct 9, 2007
Image sensor having pinned floating diffusion diode
MICRON TECHNOLOGY INC2 citations63
US7164161B2Jan 16, 2007
Method of formation of dual gate structure for imagers
MICRON TECHNOLOGY INC2 citations63
US7394056B2Jul 1, 2008
Image sensor having pinned floating diffusion diode
MICRON TECHNOLOGY INC0 citations52
APTINA IMAGING CORP
10 patentsUS7718459B2May 18, 2010
Dual conversion gain pixel using Schottky and ohmic contacts to the floating diffusion region and methods of fabrication and operation
APTINA IMAGING CORP8 citations84
US7638825B2Dec 29, 2009
Imaging with gate controlled charge storage
APTINA IMAGING CORP11 citations84
US7829832B2Nov 9, 2010
Method for operating a pixel cell using multiple pulses to a transistor transfer gate
APTINA IMAGING CORP19 citations81
US7777169B2Aug 17, 2010
Imager pixel with capacitance circuit for boosting reset voltage
APTINA IMAGING CORP5 citations74
US7772627B2Aug 10, 2010
Image sensor with floating diffusion gate capacitor
APTINA IMAGING CORP7 citations74
US7687832B2Mar 30, 2010
Method of fabricating a storage gate pixel design
APTINA IMAGING CORP7 citations74
US7498623B2Mar 3, 2009
Image sensor with floating diffusion gate capacitor
APTINA IMAGING CORP7 citations74
US7830412B2Nov 9, 2010
Method and apparatus for shielding correction pixels from spurious charges in an imager
APTINA IMAGING CORP4 citations58
US7635624B2Dec 22, 2009
Dual gate structure for imagers and method of formation
APTINA IMAGING CORP0 citations52
US7517717B2Apr 14, 2009
Wide dynamic range sensor having a pinned diode with multiple pinned voltages
APTINA IMAGING CORP0 citations51
SEMICONDUCTOR COMPONENTS IND LLC
3 patentsUS9654712B2May 16, 2017
Pixels with a global shutter and high dynamic range
SEMICONDUCTOR COMPONENTS IND LLC27 citations94
US9570494B1Feb 14, 2017
Method for forming a semiconductor image sensor device
SEMICONDUCTOR COMPONENTS IND LLC15 citations82
US9711556B2Jul 18, 2017
Semiconductor image sensor structure having metal-filled trench contact
SEMICONDUCTOR COMPONENTS IND LLC0 citations50