P

Inventor

WANG YU-REN

TW112 patents
⚠️ This page may combine multiple inventors who share the name “WANG YU-REN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UNITED MICROELECTRONICS CORP

45 patents
US9847247B2Dec 19, 2017

Method for filling gaps of semiconductor device and semiconductor device formed by the same

UNITED MICROELECTRONICS CORP284 citations97
US10475709B1Nov 12, 2019

Semiconductor device and method for fabricating the same

UNITED MICROELECTRONICS CORP16 citations93
US9793174B1Oct 17, 2017

FinFET device on silicon-on-insulator and method of forming the same

UNITED MICROELECTRONICS CORP22 citations92
US9716165B1Jul 25, 2017

Field-effect transistor and method of making the same

UNITED MICROELECTRONICS CORP15 citations92
US9685533B1Jun 20, 2017

Transistor with SiCN/SiOCN mulitlayer spacer

UNITED MICROELECTRONICS CORP17 citations92
US9431483B1Aug 30, 2016

Nanowire and method of fabricating the same

UNITED MICROELECTRONICS CORP16 citations92
US7037773B2May 2, 2006

Method of manufacturing metal-oxide-semiconductor transistor

UNITED MICROELECTRONICS CORP44 citations90
US9130014B2Sep 8, 2015

Method for fabricating shallow trench isolation structure

UNITED MICROELECTRONICS CORP8 citations84
US7312139B2Dec 25, 2007

Method of fabricating nitrogen-containing gate dielectric layer and semiconductor device

UNITED MICROELECTRONICS CORP18 citations84
US6943085B2Sep 13, 2005

Method of manufacturing metal-oxide-semiconductor transistor

UNITED MICROELECTRONICS CORP14 citations84
US9646889B1May 9, 2017

Method of removing a hard mask layer on a gate structure while forming a protective layer on the surface of a substrate

UNITED MICROELECTRONICS CORP5 citations83
US9419089B1Aug 16, 2016

Semiconductor structure and manufacturing method thereof

UNITED MICROELECTRONICS CORP7 citations83
US10332981B1Jun 25, 2019

Semiconductor device and method for fabricating the same

UNITED MICROELECTRONICS CORP5 citations82
US9685319B2Jun 20, 2017

Method for filling gaps of semiconductor device and semiconductor device formed by the same

UNITED MICROELECTRONICS CORP5 citations82
US9356125B1May 31, 2016

Manufacturing method of semiconductor structure

UNITED MICROELECTRONICS CORP7 citations82
US11527448B2Dec 13, 2022

Semiconductor device and method for fabricating the same

UNITED MICROELECTRONICS CORP2 citations73
US10910277B2Feb 2, 2021

Semiconductor device and method for fabricating the same

UNITED MICROELECTRONICS CORP2 citations73
US9882022B2Jan 30, 2018

Method for manufacturing transistor with SiCN/SiOCN multilayer spacer

UNITED MICROELECTRONICS CORP2 citations73
US6893909B2May 17, 2005

Method of manufacturing metal-oxide-semiconductor transistor

UNITED MICROELECTRONICS CORP8 citations73
US11508818B2Nov 22, 2022

Semiconductor device with strain relaxed layer

UNITED MICROELECTRONICS CORP2 citations72
US10796943B2Oct 6, 2020

Manufacturing method of semiconductor structure

UNITED MICROELECTRONICS CORP2 citations72
US10366991B1Jul 30, 2019

Semiconductor device and manufacturing method thereof

UNITED MICROELECTRONICS CORP2 citations72
US10312084B2Jun 4, 2019

Semiconductor device and fabrication method thereof

UNITED MICROELECTRONICS CORP3 citations72
US10079143B2Sep 18, 2018

Method of forming semiconductor device having wick structure

UNITED MICROELECTRONICS CORP3 citations72
US9960084B1May 1, 2018

Method for forming semiconductor device

UNITED MICROELECTRONICS CORP3 citations72
US9793105B1Oct 17, 2017

Fabricating method of fin field effect transistor (FinFET)

UNITED MICROELECTRONICS CORP2 citations72
US9748111B2Aug 29, 2017

Method of fabricating semiconductor structure using planarization process and cleaning process

UNITED MICROELECTRONICS CORP2 citations72
US9728397B1Aug 8, 2017

Semiconductor device having the insulating layers cover a bottom portion of the fin shaped structure

UNITED MICROELECTRONICS CORP2 citations72
US9613808B1Apr 4, 2017

Method of forming multilayer hard mask with treatment for removing impurities and forming dangling bonds

UNITED MICROELECTRONICS CORP2 citations72
US9543408B1Jan 10, 2017

Method of forming patterned hard mask layer

UNITED MICROELECTRONICS CORP2 citations72
US9449829B1Sep 20, 2016

Semiconductor process

UNITED MICROELECTRONICS CORP4 citations72
US9034705B2May 19, 2015

Method of forming semiconductor device

UNITED MICROELECTRONICS CORP5 citations72
US11049971B2Jun 29, 2021

Semiconductor device having epitaxial structure

UNITED MICROELECTRONICS CORP2 citations71
US10446667B2Oct 15, 2019

Method for fabricating semiconductor device

UNITED MICROELECTRONICS CORP2 citations71
US12224339B2Feb 11, 2025

High electron mobility transistor

UNITED MICROELECTRONICS CORP0 citations62
US12205905B2Jan 21, 2025

Semiconductor structure

UNITED MICROELECTRONICS CORP0 citations62
US12159930B2Dec 3, 2024

High electron mobility transistor and method of forming the same

UNITED MICROELECTRONICS CORP0 citations62
US12119272B2Oct 15, 2024

Semiconductor device and method for fabricating the same

UNITED MICROELECTRONICS CORP0 citations62
US12046639B2Jul 23, 2024

Semiconductor device with strain relaxed layer

UNITED MICROELECTRONICS CORP0 citations62
US12046640B2Jul 23, 2024

Semiconductor device with strain relaxed layer

UNITED MICROELECTRONICS CORP0 citations62
US11955519B2Apr 9, 2024

Semiconductor device with strain relaxed layer

UNITED MICROELECTRONICS CORP0 citations62
US11876122B2Jan 16, 2024

Method for forming semiconductor device

UNITED MICROELECTRONICS CORP0 citations62
US11791413B2Oct 17, 2023

Semiconductor device and fabrication method thereof

UNITED MICROELECTRONICS CORP0 citations62
US11791219B2Oct 17, 2023

Semiconductor device and method for fabricating the same

UNITED MICROELECTRONICS CORP0 citations62
US11695067B2Jul 4, 2023

High electron mobility transistor and fabrication method thereof

UNITED MICROELECTRONICS CORP0 citations62

Wang shao-wei

2 patents

LIN CHIEN-LIANG

1 patent

LU TSUO-WEN

1 patent

WANG YU-REN

1 patent

Showing the top 50 of 112 patents by PatentIndex Score.