Inventor
WANG YU-REN
TW112 patents
⚠️ This page may combine multiple inventors who share the name “WANG YU-REN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
45 patentsUS9847247B2Dec 19, 2017
Method for filling gaps of semiconductor device and semiconductor device formed by the same
UNITED MICROELECTRONICS CORP284 citations97
US10475709B1Nov 12, 2019
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP16 citations93
US9793174B1Oct 17, 2017
FinFET device on silicon-on-insulator and method of forming the same
UNITED MICROELECTRONICS CORP22 citations92
US9716165B1Jul 25, 2017
Field-effect transistor and method of making the same
UNITED MICROELECTRONICS CORP15 citations92
US9685533B1Jun 20, 2017
Transistor with SiCN/SiOCN mulitlayer spacer
UNITED MICROELECTRONICS CORP17 citations92
US9431483B1Aug 30, 2016
Nanowire and method of fabricating the same
UNITED MICROELECTRONICS CORP16 citations92
US7037773B2May 2, 2006
Method of manufacturing metal-oxide-semiconductor transistor
UNITED MICROELECTRONICS CORP44 citations90
US9130014B2Sep 8, 2015
Method for fabricating shallow trench isolation structure
UNITED MICROELECTRONICS CORP8 citations84
US7312139B2Dec 25, 2007
Method of fabricating nitrogen-containing gate dielectric layer and semiconductor device
UNITED MICROELECTRONICS CORP18 citations84
US6943085B2Sep 13, 2005
Method of manufacturing metal-oxide-semiconductor transistor
UNITED MICROELECTRONICS CORP14 citations84
US9646889B1May 9, 2017
Method of removing a hard mask layer on a gate structure while forming a protective layer on the surface of a substrate
UNITED MICROELECTRONICS CORP5 citations83
US9419089B1Aug 16, 2016
Semiconductor structure and manufacturing method thereof
UNITED MICROELECTRONICS CORP7 citations83
US10332981B1Jun 25, 2019
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP5 citations82
US9685319B2Jun 20, 2017
Method for filling gaps of semiconductor device and semiconductor device formed by the same
UNITED MICROELECTRONICS CORP5 citations82
US9356125B1May 31, 2016
Manufacturing method of semiconductor structure
UNITED MICROELECTRONICS CORP7 citations82
US11527448B2Dec 13, 2022
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP2 citations73
US10910277B2Feb 2, 2021
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP2 citations73
US9882022B2Jan 30, 2018
Method for manufacturing transistor with SiCN/SiOCN multilayer spacer
UNITED MICROELECTRONICS CORP2 citations73
US6893909B2May 17, 2005
Method of manufacturing metal-oxide-semiconductor transistor
UNITED MICROELECTRONICS CORP8 citations73
US11508818B2Nov 22, 2022
Semiconductor device with strain relaxed layer
UNITED MICROELECTRONICS CORP2 citations72
US10796943B2Oct 6, 2020
Manufacturing method of semiconductor structure
UNITED MICROELECTRONICS CORP2 citations72
US10366991B1Jul 30, 2019
Semiconductor device and manufacturing method thereof
UNITED MICROELECTRONICS CORP2 citations72
US10312084B2Jun 4, 2019
Semiconductor device and fabrication method thereof
UNITED MICROELECTRONICS CORP3 citations72
US10079143B2Sep 18, 2018
Method of forming semiconductor device having wick structure
UNITED MICROELECTRONICS CORP3 citations72
US9960084B1May 1, 2018
Method for forming semiconductor device
UNITED MICROELECTRONICS CORP3 citations72
US9793105B1Oct 17, 2017
Fabricating method of fin field effect transistor (FinFET)
UNITED MICROELECTRONICS CORP2 citations72
US9748111B2Aug 29, 2017
Method of fabricating semiconductor structure using planarization process and cleaning process
UNITED MICROELECTRONICS CORP2 citations72
US9728397B1Aug 8, 2017
Semiconductor device having the insulating layers cover a bottom portion of the fin shaped structure
UNITED MICROELECTRONICS CORP2 citations72
US9613808B1Apr 4, 2017
Method of forming multilayer hard mask with treatment for removing impurities and forming dangling bonds
UNITED MICROELECTRONICS CORP2 citations72
US9543408B1Jan 10, 2017
Method of forming patterned hard mask layer
UNITED MICROELECTRONICS CORP2 citations72
US9449829B1Sep 20, 2016
Semiconductor process
UNITED MICROELECTRONICS CORP4 citations72
US9034705B2May 19, 2015
Method of forming semiconductor device
UNITED MICROELECTRONICS CORP5 citations72
US11049971B2Jun 29, 2021
Semiconductor device having epitaxial structure
UNITED MICROELECTRONICS CORP2 citations71
US10446667B2Oct 15, 2019
Method for fabricating semiconductor device
UNITED MICROELECTRONICS CORP2 citations71
US12224339B2Feb 11, 2025
High electron mobility transistor
UNITED MICROELECTRONICS CORP0 citations62
US12205905B2Jan 21, 2025
Semiconductor structure
UNITED MICROELECTRONICS CORP0 citations62
US12159930B2Dec 3, 2024
High electron mobility transistor and method of forming the same
UNITED MICROELECTRONICS CORP0 citations62
US12119272B2Oct 15, 2024
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US12046639B2Jul 23, 2024
Semiconductor device with strain relaxed layer
UNITED MICROELECTRONICS CORP0 citations62
US12046640B2Jul 23, 2024
Semiconductor device with strain relaxed layer
UNITED MICROELECTRONICS CORP0 citations62
US11955519B2Apr 9, 2024
Semiconductor device with strain relaxed layer
UNITED MICROELECTRONICS CORP0 citations62
US11876122B2Jan 16, 2024
Method for forming semiconductor device
UNITED MICROELECTRONICS CORP0 citations62
US11791413B2Oct 17, 2023
Semiconductor device and fabrication method thereof
UNITED MICROELECTRONICS CORP0 citations62
US11791219B2Oct 17, 2023
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US11695067B2Jul 4, 2023
High electron mobility transistor and fabrication method thereof
UNITED MICROELECTRONICS CORP0 citations62
Wang shao-wei
2 patentsLIN CHIEN-LIANG
1 patentLU TSUO-WEN
1 patentWANG YU-REN
1 patentShowing the top 50 of 112 patents by PatentIndex Score.