Inventor
BERTSCH JOHN E
US3 patents
Patents
3 patentsUS5485095AJan 16, 1996
Fabrication test circuit and method for signalling out-of-spec resistance in integrated circuit structure
IBM51 citations91
US6934671B2Aug 23, 2005
Method and system for including parametric in-line test data in simulations for improved model to hardware correlation
IBM28 citations87
US4707667ANov 17, 1987
Offset corrected amplifier
IBM4 citations57