Inventor

MCCORD MARK A

US52 patents

⚠️ This page may combine multiple inventors who share the name “MCCORD MARK A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MCCORD MARK A

CEPTON TECHNOLOGIES INC

Apparatuses for scanning a lidar system in two dimensions

Multi-range three-dimensional imaging systems

Scanning lidar systems for three-dimensional sensing

Methods for scanning a LiDAR system in two dimensions

Lidar system including a transceiver array

Calibration of LiDAR sensors

Detector designs for improved resolution in lidar systems

Optical designs using cylindrical lenses for improved resolution in lidar systems

Systems and methods for light projection

Systems and methods for imaging using mechanical scanning mechanisms

Techniques for detecting cross-talk interferences in LiDAR imaging sensors with multiple light sources

Techniques for detecting cross-talk interferences in LiDAR imaging sensors

Dynamic calibration of lidar sensors

Scanning lidar systems with moving lens assembly

Half and quarter lissajous scan patterns for LiDAR

Systems for incorporating LiDAR sensors in a headlamp module of a vehicle

KLA TENCOR CORP

Electron beam inspection system using multiple electron beams and uniform focus and deflection mechanisms

Scanning electron beam microscope having an electrode for controlling charge build up during scanning of a sample

Robust measurement of parameters

Quasi-annular reflective electron patterning device

Method and system for focus adjustment of a multi-beam scanning electron microscopy system

Multi-beam dark field imaging

Light collection optics for measuring flux and spectrum from light-emitting devices

Backscattered electrons (BSE) imaging using multi-beam tools

Method and system for noise mitigation in a multi-beam scanning electron microscopy system

Electron microscope assembly for viewing the wafer plane image of an electron beam lithography tool

Inspection system

Virtual ground for target substrate using floodgun and feedback control

Alignment sensor and height sensor

KLA TENCOR TECH CORP

High-speed electron beam inspection

Electrical process monitoring using mirror-mode electron microscopy

Method and apparatus for beam current fluctuation correction

Simultaneous flooding and inspection for charge control in an electron beam inspection machine

Apparatus and methods of controlling surface charge and focus

High-speed high-efficiency solid-state electron detector

Method for charging substrate to a potential

Accelerating electrostatic lens gun for high-speed electron beam inspection

Method for charging substrate to a potential

IBM

X-ray mask containing a cantilevered tip for gap control and alignment

Electrical probe incorporating scanning proximity microscope

Mechanical stage support for a scanning tunneling microscope

MCCORD MARK A

Hydrodynamic human-powered propulsion mechanism

Suspended membrane calibration sample

UNIV LELAND STANFORD JUNIOR

Systems, methods and computer program products for detecting the position of a new alignment mark on a substrate based on fitting to sample alignment signals

INTEVAC INC

Electron sources utilizing patterned negative electron affinity photocathodes

KLA TENCOR

In-situ probe for optimizing electron beam inspection and metrology based on surface potential

BRODIE ALAN D

Well-based dynamic pattern generator

LAUBER JAN

Automated inspection using cell-cell subtraction perpendicular to stage motion direction

GRELLA LUCA

Electron reflector with multiple reflective modes

KLA TENCOR TECHNOLOGIES CORPRO

Electronically-variable immersion electrostatic lens