Inventor
AKUTSU HARUKO
JP12 patents
⚠️ This page may combine multiple inventors who share the name “AKUTSU HARUKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
8 patentsUS8841614B1Sep 23, 2014
Sample structure analyzing method, transmission electron microscope, and computer-readable non-transitory recording medium
TOSHIBA KK4 citations72
US7495293B2Feb 24, 2009
Semiconductor device and method for manufacturing the same
TOSHIBA KK2 citations62
US9431229B2Aug 30, 2016
Sputter neutral particle mass spectrometry apparatus with optical element
TOSHIBA KK2 citations58
US7557040B2Jul 7, 2009
Method of manufacture of semiconductor device
TOSHIBA KK0 citations51
US11062894B2Jul 13, 2021
Mass spectrometer and mass spectrometry method
TOSHIBA KK0 citations50
US9734985B2Aug 15, 2017
Analytical apparatus, sample holder and analytical method
TOSHIBA KK0 citations47
US7145658B2Dec 5, 2006
Apparatus and method for evaluating semiconductor material
TOSHIBA KK1 citations46
US9287104B2Mar 15, 2016
Material inspection apparatus and material inspection method
TOSHIBA KK0 citations39
TOSHIBA MEMORY CORP
3 patentsUS10916405B2Feb 9, 2021
Atom probe inspection device, field ion microscope, and distortion correction method
TOSHIBA MEMORY CORP0 citations48
US10345336B2Jul 9, 2019
Scanning probe microscope and measurement method using the same
TOSHIBA MEMORY CORP0 citations40
US10553416B2Feb 4, 2020
Mass spectrometer performing mass spectrometry for sample with laser irradiation
TOSHIBA MEMORY CORP0 citations36