P

Inventor

OSE YOICHI

JP72 patents
⚠️ This page may combine multiple inventors who share the name “OSE YOICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI LTD

31 patents
US6847038B2Jan 25, 2005

Scanning electron microscope

HITACHI LTD74 citations98
US5668368ASep 16, 1997

Apparatus for suppressing electrification of sample in charged beam irradiation apparatus

HITACHI LTD98 citations98
US6946656B2Sep 20, 2005

Sample electrification measurement method and charged particle beam apparatus

HITACHI LTD56 citations96
US6646262B1Nov 11, 2003

Scanning electron microscope

HITACHI LTD57 citations96
US5894124AApr 13, 1999

Scanning electron microscope and its analogous device

HITACHI LTD61 citations96
US5608218AMar 4, 1997

Scanning electron microscope

HITACHI LTD69 citations96
US5576538ANov 19, 1996

Apparatus and method for ion beam neutralization

HITACHI LTD47 citations96
US5466929ANov 14, 1995

Apparatus and method for suppressing electrification of sample in charged beam irradiation apparatus

HITACHI LTD37 citations96
US7075078B2Jul 11, 2006

Scanning electron microscope

HITACHI LTD20 citations93
US6885001B2Apr 26, 2005

Scanning electron microscope

HITACHI LTD20 citations93
US6787772B2Sep 7, 2004

Scanning electron microscope

HITACHI LTD32 citations93
US6121610ASep 19, 2000

Ion trap mass spectrometer

HITACHI LTD34 citations93
US6043491AMar 28, 2000

Scanning electron microscope

HITACHI LTD44 citations93
US5633496AMay 27, 1997

Mass spectrometry apparatus

HITACHI LTD19 citations93
US5623144AApr 22, 1997

Mass spectrometer ring-shaped electrode having high ion selection efficiency and mass spectrometry method thereby

HITACHI LTD23 citations93
US7372028B2May 13, 2008

Sample electrification measurement method and charged particle beam apparatus

HITACHI LTD14 citations92
US7087899B2Aug 8, 2006

Sample electrification measurement method and charged particle beam apparatus

HITACHI LTD19 citations92
US6872944B2Mar 29, 2005

Scanning electron microscope

HITACHI LTD24 citations92
US6667476B2Dec 23, 2003

Scanning electron microscope

HITACHI LTD40 citations92
US6555819B1Apr 29, 2003

Scanning electron microscope

HITACHI LTD19 citations92
US6501077B1Dec 31, 2002

Scanning electron microscope

HITACHI LTD31 citations92
US5756993AMay 26, 1998

Mass spectrometer

HITACHI LTD26 citations92
US7700918B2Apr 20, 2010

Sample electrification measurement method and charged particle beam apparatus

HITACHI LTD8 citations84
US7049591B2May 23, 2006

Scanning electron microscope

HITACHI LTD11 citations84
US6140641AOct 31, 2000

Ion-trap mass analyzing apparatus and ion trap mass analyzing method

HITACHI LTD17 citations84
US7399966B2Jul 15, 2008

Scanning electron microscope

HITACHI LTD6 citations74
US5668372ASep 16, 1997

Scanning electron microscope and its analogous device

HITACHI LTD9 citations74
US5532483AJul 2, 1996

Mass spectrometer and ion source

HITACHI LTD10 citations74
US5095208AMar 10, 1992

Charged particle generating device and focusing lens therefor

HITACHI LTD14 citations72
US5089699AFeb 18, 1992

Secondary charged particle analyzing apparatus and secondary charged particle extracting section

HITACHI LTD13 citations71
US5677530AOct 14, 1997

Scanning electron microscope

HITACHI LTD15 citations69

HITACHI HIGH TECH CORP

16 patents
US7022983B2Apr 4, 2006

Monochromator and scanning electron microscope using the same

HITACHI HIGH TECH CORP15 citations93
US6956211B2Oct 18, 2005

Charged particle beam apparatus and charged particle beam irradiation method

HITACHI HIGH TECH CORP15 citations93
US6982427B2Jan 3, 2006

Electron beam apparatus with aberration corrector

HITACHI HIGH TECH CORP18 citations92
US7411192B2Aug 12, 2008

Focused ion beam apparatus and focused ion beam irradiation method

HITACHI HIGH TECH CORP12 citations84
US7282722B2Oct 16, 2007

Charged particle beam apparatus and charged particle beam irradiation method

HITACHI HIGH TECH CORP10 citations84
US7825377B2Nov 2, 2010

Electron beam apparatus with aberration corrector

HITACHI HIGH TECH CORP6 citations74
US7459681B2Dec 2, 2008

Scanning electron microscope

HITACHI HIGH TECH CORP8 citations74
US7408172B2Aug 5, 2008

Charged particle beam apparatus and charged particle beam irradiation method

HITACHI HIGH TECH CORP8 citations74
US7375323B2May 20, 2008

Electron beam apparatus with aberration corrector

HITACHI HIGH TECH CORP4 citations74
US7315024B2Jan 1, 2008

Monochromator and scanning electron microscope using the same

HITACHI HIGH TECH CORP5 citations74
US7199365B2Apr 3, 2007

Electron beam apparatus with aberration corrector

HITACHI HIGH TECH CORP4 citations74
US11251011B2Feb 15, 2022

Electron microscope

HITACHI HIGH TECH CORP3 citations73
US10707046B2Jul 7, 2020

Electron source and electron beam device using the same

HITACHI HIGH TECH CORP3 citations73
US9640360B2May 2, 2017

Ion source and ion beam device using same

HITACHI HIGH TECH CORP2 citations73
US7030376B2Apr 18, 2006

Electron beam apparatus and method for production of its specimen chamber

HITACHI HIGH TECH CORP6 citations72
US9653256B2May 16, 2017

Charged particle-beam device

HITACHI HIGH TECH CORP4 citations71

FUKUDA MUNEYUKI

1 patent
US9123501B2Sep 1, 2015

Device for correcting diffraction aberration of electron beam

FUKUDA MUNEYUKI4 citations73

KAWANAMI YOSHIMI

1 patent
US8847173B2Sep 30, 2014

Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing same

KAWANAMI YOSHIMI5 citations70

WATANABE SHUN-ICHI

1 patent
US9293293B2Mar 22, 2016

Electron gun and charged particle beam device having an aperture with flare-suppressing coating

WATANABE SHUN-ICHI3 citations66

Showing the top 50 of 72 patents by PatentIndex Score.