Inventor

IKEGAMI AKIRA

JP59 patents

⚠️ This page may combine multiple inventors who share the name “IKEGAMI AKIRA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IKEGAMI AKIRA

HITACHI LTD

Gas detection device and method for detecting gas

Sample electrification measurement method and charged particle beam apparatus

Process for manufacturing a multilayer circuit board

Sample electrification measurement method and charged particle beam apparatus

Sample electrification measurement method and charged particle beam apparatus

Air-fuel ratio detector

Gas detecting apparatus

Glass multilayer wiring board and method for its manufacture

Thick-film multi-layer wiring board

Sample electrification measurement method and charged particle beam apparatus

Pressure transducer

Electrically conductive paste, electronic circuit component and method for producing same

Thermistor composition

Magnetic head containing amorphous alloy and crystallizable glass

Substrate for hybrid IC, hybrid IC using the substrate and its applications

Low temperature-sinterable dielectric composition and thick film capacitor using the same

Thick film thermistor composition

Process for making sensor for detecting fluid flow velocity or flow amount

Thermistor composition and thick film thermistor

Dew sensor

Critical temperature sensitive resistor material

Semiconductor device

HITACHI HIGH TECH CORP

Scanning electron microscope having time constant measurement capability

Scanning electron microscope

Charged particle beam application device

Beam irradiation device

Charged particle beam device

Charged particle beam device

Charged particle beam apparatus

Charged particle beam application apparatus

Charged-particle beam device

Charged particle-beam device

Photoelectron emission microscope

Charged particle beam device

Beam irradiation device

Method for inspecting and measuring sample and scanning electron microscope

Charged particle beam apparatus

Charged particle beam apparatus

Electron beam application apparatus

Charged particle beam apparatus

Method for detecting information of an electric potential on a sample and charged particle beam apparatus

Charged particle beam device and electrostatic lens

YAMAZAKI MINORU

Method for detecting information of an electric potential on a sample and charged particle beam apparatus

Scanning electron microscope

HUKUBA DENTAL KABUSHIKI KAISHA

Contact-breaker device, circuit and apparatus comprising the same, and method for assembling contact-breaker device

IKEGAMI AKIRA

Scanning electron microscope having time constant measurement capability

HITACHI CHEMICAL CO LTD

Low temperature sintering porcelain composition

EZUMI MAKOTO

Method for inspecting and measuring sample and scanning electron microscope

SAN EI GEN FFI INC

Use of enzyme-modified isoquercitrin

FUJI ELECTRIC CO LTD

Power converter