P

Inventor

ISHIJIMA TATSUAKI

JP8 patents
⚠️ This page may combine multiple inventors who share the name “ISHIJIMA TATSUAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI LTD

4 patents
US6946656B2Sep 20, 2005

Sample electrification measurement method and charged particle beam apparatus

HITACHI LTD56 citations96
US7372028B2May 13, 2008

Sample electrification measurement method and charged particle beam apparatus

HITACHI LTD14 citations92
US7087899B2Aug 8, 2006

Sample electrification measurement method and charged particle beam apparatus

HITACHI LTD19 citations92
US7700918B2Apr 20, 2010

Sample electrification measurement method and charged particle beam apparatus

HITACHI LTD8 citations84

ISHIJIMA TATSUAKI

2 patents
US8178836B2May 15, 2012

Electrostatic charge measurement method, focus adjustment method, and scanning electron microscope

ISHIJIMA TATSUAKI0 citations46
US9129775B2Sep 8, 2015

Specimen potential measuring method, and charged particle beam device

ISHIJIMA TATSUAKI0 citations35

HITACHI HIGH TECH CORP

1 patent
US7745782B2Jun 29, 2010

Electrostatic charge measurement method, focus adjustment method, and scanning electron microscope

HITACHI HIGH TECH CORP7 citations73

EZUMI MAKOTO

1 patent
US8835844B2Sep 16, 2014

Sample electrification measurement method and charged particle beam apparatus

EZUMI MAKOTO0 citations49