Inventor
FUKAYA RITSUO
JP19 patents
⚠️ This page may combine multiple inventors who share the name “FUKAYA RITSUO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
8 patentsUS6184946B1Feb 6, 2001
Active matrix liquid crystal display
HITACHI LTD88 citations98
US6946656B2Sep 20, 2005
Sample electrification measurement method and charged particle beam apparatus
HITACHI LTD56 citations96
US7372028B2May 13, 2008
Sample electrification measurement method and charged particle beam apparatus
HITACHI LTD14 citations92
US7087899B2Aug 8, 2006
Sample electrification measurement method and charged particle beam apparatus
HITACHI LTD19 citations92
US6300995B1Oct 9, 2001
Liquid crystal display device utilizing in-plane-switching system and having alignment film separating picture element electrode or counter electrode from liquid crystal layer
HITACHI LTD17 citations92
US5995187ANov 30, 1999
Liquid crystal display device in-plane-switching system with counter electrode in contact with liquid crystal
HITACHI LTD25 citations92
US7700918B2Apr 20, 2010
Sample electrification measurement method and charged particle beam apparatus
HITACHI LTD8 citations84
US7659508B2Feb 9, 2010
Method for measuring dimensions of sample and scanning electron microscope
HITACHI LTD11 citations84
HITACHI HIGH TECH CORP
5 patentsUS7745782B2Jun 29, 2010
Electrostatic charge measurement method, focus adjustment method, and scanning electron microscope
HITACHI HIGH TECH CORP7 citations73
US7851756B2Dec 14, 2010
Charged particle beam irradiation system
HITACHI HIGH TECH CORP4 citations63
US8969801B2Mar 3, 2015
Scanning electron microscope
HITACHI HIGH TECH CORP2 citations62
US12379392B2Aug 5, 2025
Surface analysis device
HITACHI HIGH TECH CORP0 citations56
US7566872B2Jul 28, 2009
Scanning electron microscope
HITACHI HIGH TECH CORP1 citations52