Inventor
SU QING
CN29 patents
⚠️ This page may combine multiple inventors who share the name “SU QING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SYNOPSYS INC
13 patentsUS7346865B2Mar 18, 2008
Fast evaluation of average critical area for IC layouts
SYNOPSYS INC23 citations92
US7707526B2Apr 27, 2010
Predicting IC manufacturing yield based on hotspots
SYNOPSYS INC11 citations84
US7543255B2Jun 2, 2009
Method and apparatus to reduce random yield loss
SYNOPSYS INC8 citations84
US8762918B2Jun 24, 2014
Banded computation architectures
SYNOPSYS INC7 citations83
US7289933B2Oct 30, 2007
Simulating topography of a conductive material in a semiconductor wafer
SYNOPSYS INC10 citations81
US7679872B2Mar 16, 2010
Electrostatic-discharge protection using a micro-electromechanical-system switch
SYNOPSYS INC7 citations73
US11531797B1Dec 20, 2022
Vector generation for maximum instantaneous peak power
SYNOPSYS INC3 citations65
US8999766B2Apr 7, 2015
ESD/antenna diodes for through-silicon vias
SYNOPSYS INC1 citations62
US8000826B2Aug 16, 2011
Predicting IC manufacturing yield by considering both systematic and random intra-die process variations
SYNOPSYS INC4 citations62
US7962873B2Jun 14, 2011
Fast evaluation of average critical area for ic layouts
SYNOPSYS INC2 citations62
US7962882B2Jun 14, 2011
Fast evaluation of average critical area for IC layouts
SYNOPSYS INC1 citations62
US11651131B2May 16, 2023
Glitch source identification and ranking
SYNOPSYS INC0 citations49
US12001768B1Jun 4, 2024
Enhanced glitch estimation in vectorless power analysis
SYNOPSYS INC0 citations41
SU QING
9 patentsUS8264065B2Sep 11, 2012
ESD/antenna diodes for through-silicon vias
SU QING242 citations97
US8151236B2Apr 3, 2012
Steiner tree based approach for polygon fracturing
SU QING8 citations82
USD1093046SSep 16, 2025
Storage rack
SU QING1 citations63
USD1091203SSep 2, 2025
Watch stand
SU QING1 citations63
US9373616B1Jun 21, 2016
Electrostatic protective device
SU QING2 citations62
US8205185B2Jun 19, 2012
Fast evaluation of average critical area for IC layouts
SU QING1 citations62
US8205179B2Jun 19, 2012
Fast evaluation of average critical area for IC layouts
SU QING1 citations62
US8878370B2Nov 4, 2014
Bond pad structure
SU QING0 citations51
US8803280B2Aug 12, 2014
High-voltage ESD protection device
SU QING0 citations41
HUAWEI TECH CO LTD
4 patentsUS11521012B2Dec 6, 2022
Method for training neural network model and apparatus
HUAWEI TECH CO LTD2 citations73
US11966844B2Apr 23, 2024
Method for training neural network model and apparatus
HUAWEI TECH CO LTD0 citations62
US9519652B2Dec 13, 2016
Method, apparatus, and system for operating shared resource in asynchronous multiprocessing system
HUAWEI TECH CO LTD2 citations58
US11940992B2Mar 26, 2024
Model file management method and terminal device
HUAWEI TECH CO LTD0 citations44