Inventor
LEE KYOUNG HWAN
KR3 patents
Patents
3 patentsUS10551326B2Feb 4, 2020
Method for measuring semiconductor device
SAMSUNG ELECTRONICS CO LTD2 citations65
US11181831B2Nov 23, 2021
Methods of manufacturing semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations59
US10852259B2Dec 1, 2020
Apparatus for X-ray inspection, and a method for manufacturing a semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD0 citations39