Inventor

DE VOS HENDRIK JAN

NL3 patents

Patents

3 patents

US9361275B2Jun 7, 2016

Method for analyzing an EDS signal

FEI CO2 citations58

US10002742B2Jun 19, 2018

Composite scan path in a charged particle microscope

FEI CO1 citations49

US8624206B2Jan 7, 2014

Pattern modification schemes for improved FIB patterning

FEI CO0 citations47