Inventor
AGARWALA BIRENDRA
US4 patents
⚠️ This page may combine multiple inventors who share the name “AGARWALA BIRENDRA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
3 patentsUS7397260B2Jul 8, 2008
Structure and method for monitoring stress-induced degradation of conductive interconnects
IBM169 citations98
US7639032B2Dec 29, 2009
Structure for monitoring stress-induced degradation of conductive interconnects
IBM2 citations62
US7692439B2Apr 6, 2010
Structure for modeling stress-induced degradation of conductive interconnects
IBM0 citations51