Inventor

ITSUJI TAKEAKI

JP74 patents

⚠️ This page may combine multiple inventors who share the name “ITSUJI TAKEAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ITSUJI TAKEAKI

CANON KK

Spatial position detection method, information input method, spatial position detection apparatus, and information input apparatus

Detecting apparatus, and detecting method

Apparatus and method for obtaining information related to terahertz waves

Planar antenna apparatus

Signal detector and probe microscope using the same

Non-contact type atomic microscope and observation method using it

Signal detector to be used with scanning probe and atomic force microscope

Method of identification of living body and apparatus for identification of living body

Inspection apparatus and inspection method by using terahertz wave

Active antenna oscillator

Detecting apparatus, and detecting method

Optical semiconductor device in which an electromagnetic wave is generated in a region of an applied electric field

Inspection apparatus using terahertz wave

Antenna device

Planar antenna apparatus

Object information acquisition apparatus and object information acquisition method

Sensing device employing electromagnetic waves

Antenna device

Image forming apparatus

Image capture device, method of capturing image with the same, and irradiation device

Inspection apparatus and inspection method using electromagnetic wave

Transmission apparatus, measurement system, and camera system

Image capture device, method of capturing image with the same, and irradiation device

Illumination apparatus and camera system

Measurement apparatus and method, tomography apparatus and method

Electromagnetic wave generating device, electromagnetic wave integrated device, and electromagnetic wave detector

Electromagnetic-wave oscillator

Measuring apparatus using terahertz wave

Apparatus and method for obtaining information related to terahertz waves

Inspection apparatus

Sensor for analyzing or identifying property of object, sensing apparatus using same, and sensing method

Electromagnetic-wave oscillator

Specimen testing element, specimen information obtaining method and specimen testing apparatus

Optical element with periodic structure

Detection apparatus and detection method to be used for scanning probe and observation apparatus and observation method

Processing system

Terahertz wave camera system and method for controlling terahertz wave camera system

Terahertz wave camera system and method for controlling terahertz wave camera system

System and method for system for generating and detecting an electromagnetic wave

Imaging system

System and method for determining an output of an electromagnetic wave based on image information

Device for radiating or receiving electromagnetic waves

ITSUJI TAKEAKI

Waveform information acquisition apparatus and waveform information acquisition method

Image forming apparatus

Apparatus and method for acquiring time waveform of terahertz waves

Image forming apparatus, printing method and printing apparatus

Photoconductive element for generation and detection of terahertz wave

KATAGIRI TAKASHI

Apparatus and method for measuring terahertz wave

CANON KABUHSIKI KAISHA

Analysis apparatus and analysis method

SEKIGUCHI RYOTA

Oscillator having negative resistance device for generating electromagnetic wave