Inventor

YU CHUN-CHI

TW46 patents

⚠️ This page may combine multiple inventors who share the name “YU CHUN-CHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

YU CHUN-CHI

REALTEK SEMICONDUCTOR CORP

Memory system and memory access interface device thereof

DDR SDRAM signal calibration device and method

Memory signal phase difference calibration circuit and method

Memory access interface device including phase and duty cycle adjusting circuits for memory access signals

Memory system and memory physical layer interface circuit

DDR SDRAM physical layer interface circuit and DDR SDRAM control device

Control circuit, sampling circuit for synchronous dynamic random-access memory, method of reading procedure and calibration thereof

On-die-termination circuit and control method for of the same

Memory device and test method of the same

Memory control circuit for adjusting reference voltage and associated memory control method

Memory controller and memory data receiving method for generate better sampling clock signal

Detection circuit and detection method

Method of foreground auto-calibrating data reception window and related device

Memory system and memory access interface device thereof

Memory control circuit and method of controlling data reading process of memory module

Physical layer circuit, write leveling training circuit and method for calibrating access control signal transmitted to memory device

Memory controller and method for calibrating data reception window

Receiver of communication system and eye diagram measuring method

Electronic device, data strobe gate signal generator circuit and data strobe gate signal generating method

Memory system and memory access interface device thereof for supporting different speed modes

Test method for delay circuit and test circuitry

Memory system and memory access interface device thereof

Memory control device for repeating data during a preamble signal or a postamble signal and memory control method

Memory system, memory access interface device and operation method thereof

Data transmission apparatus and method having clock gating mechanism

DDR SDRAM signal calibration device and method

UNITED MICROELECTRONICS CORP

Overlay target for optically measuring overlay alignment of layers formed on semiconductor wafer

Overlap mark set and method for selecting recipe of measuring overlap error

Measurement method of overlay mark

Patterning method and overlay measurement method

Method for correcting critical dimension measurements of lithographic tool

Method of correcting overlay error

Measurement method of overlay mark structure

Overlay mark structure and measurement method thereof

Method of removing step height on gate structure

Method of forming via hole

Patterning method

Method of forming gate

Photo-mask and method of manufacturing semiconductor structures by using the same

Asymmetry compensation method used in lithography overlay process

Method for designing photomask

Method and related operation system for immersion lithography

CHEN YI-TING

Overlay mark for multiple pre-layers and currently layer

WU CHENG-HAN

Method of forming via hole

CHUANG KAI-LIN

Alignment accuracy mark

HUANG YONG-FA

Method for forming photoresist patterns