Inventor
MORI MASAMI
JP28 patents
⚠️ This page may combine multiple inventors who share the name “MORI MASAMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TDK CORP
8 patentsUS5981092ANov 9, 1999
Organic El device
TDK CORP136 citations98
US6118212ASep 12, 2000
Organic electroluminescent light emitting devices
TDK CORP54 citations96
US6359384B1Mar 19, 2002
Organic electroluminescent device with electron injecting electrode containing ALLi alloy
TDK CORP21 citations92
US6215245B1Apr 10, 2001
Organic electroluminescent light emitting devices
TDK CORP40 citations92
US6187457B1Feb 13, 2001
Organic EL element and method of producing the same
TDK CORP31 citations92
US5472777ADec 5, 1995
Nonlinear optical thin film
TDK CORP22 citations92
US5401569AMar 28, 1995
Nonlinear optical thin film
TDK CORP23 citations92
US6172458B1Jan 9, 2001
Organic electroluminescent device with electrode of aluminum-lithium alloy
TDK CORP13 citations73
IKEDA BUSSAN CO
6 patentsUS5053271AOct 1, 1991
Skin covered foamed plastic article
IKEDA BUSSAN CO38 citations92
US4959184ASep 25, 1990
Method of producing skin-covered foamed plastic article
IKEDA BUSSAN CO30 citations89
US4824070AApr 25, 1989
Mold assembly for producing skin-covered foamed plastic article
IKEDA BUSSAN CO21 citations81
US5011394AApr 30, 1991
Mold for skin covered foamed plastic molding
IKEDA BUSSAN CO10 citations73
US5069838ADec 3, 1991
Method of producing frame-installed seat pad structure
IKEDA BUSSAN CO7 citations72
US5018958AMay 28, 1991
Mold for skin covered foamed plastic molding
IKEDA BUSSAN CO3 citations62
SHARP KK
3 patentsUS6850085B2Feb 1, 2005
Reference voltage generating device, semiconductor integrated circuit including the same, and testing device and method for semiconductor integrated circuit
SHARP KK11 citations74
US6833715B2Dec 21, 2004
Semiconductor testing apparatus and semiconductor testing method
SHARP KK11 citations73
US7902853B2Mar 8, 2011
Semiconductor device, semiconductor device testing method, and probe card
SHARP KK0 citations36