Inventor
CONNOR JOHN
US31 patents
⚠️ This page may combine multiple inventors who share the name “CONNOR JOHN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
18 patentsUS5796745AAug 18, 1998
Memory array built-in self test circuit for testing multi-port memory arrays
IBM105 citations97
US5535164AJul 9, 1996
BIST tester for multiple memories
IBM149 citations96
US6965503B2Nov 15, 2005
Electro-static discharge protection circuit
IBM27 citations92
US6501293B2Dec 31, 2002
Method and apparatus for programmable active termination of input/output devices
IBM27 citations92
US6140885AOct 31, 2000
On-chip automatic system for impedance matching in very high speed input-output chip interfacing
IBM24 citations92
US5793592AAug 11, 1998
Dynamic dielectric protection circuit for a receiver
IBM25 citations92
US5790564AAug 4, 1998
Memory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method therefor
IBM25 citations92
US5563833AOct 8, 1996
Using one memory to supply addresses to an associated memory during testing
IBM23 citations92
US5784323AJul 21, 1998
Test converage of embedded memories on semiconductor substrates
IBM50 citations89
US5929667AJul 27, 1999
Method and apparatus for protecting circuits subjected to high voltage
IBM19 citations83
US6278339B2Aug 21, 2001
Termination resistance independent system for impedance matching in high speed input-output chip interfacing
IBM9 citations74
US6249193B1Jun 19, 2001
Termination impedance independent system for impedance matching in high speed input-output chip interfacing
IBM7 citations74
US5815354ASep 29, 1998
Receiver input voltage protection circuit
IBM16 citations73
US5771242AJun 23, 1998
Memory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method therefor
IBM12 citations73
US5761213AJun 2, 1998
Method and apparatus to determine erroneous value in memory cells using data compression
IBM11 citations73
US5745498AApr 28, 1998
Rapid compare of two binary numbers
IBM8 citations73
US6617986B2Sep 9, 2003
Area efficient, sequential gray code to thermometer code decoder
IBM7 citations69
US6353903B1Mar 5, 2002
Method and apparatus for testing differential signals
IBM6 citations62