Inventor
VELIKOV LEONID
US33 patents
⚠️ This page may combine multiple inventors who share the name “VELIKOV LEONID”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
YANKOV VLADIMIR
8 patentsUS8596846B2Dec 3, 2013
Frontlight unit for enhancing illumination of a reflective display
YANKOV VLADIMIR40 citations92
US8870382B2Oct 28, 2014
Method of reducing speckles in liquid-crystal display with coherent illumination
YANKOV VLADIMIR2 citations60
US8797620B2Aug 5, 2014
Autostereoscopic display assembly based on digital semiplanar holography
YANKOV VLADIMIR3 citations60
US8773613B2Jul 8, 2014
Liquid-crystal display with coherent illumination and reduced speckling
YANKOV VLADIMIR2 citations60
US10168668B2Jan 1, 2019
Method of forming a rarefied hologram for video imaging and 3D lithography
YANKOV VLADIMIR0 citations40
US9164219B2Oct 20, 2015
Frontlight unit for reflective displays
YANKOV VLADIMIR0 citations40
US8861057B2Oct 14, 2014
Speckle-reduced laser illumination device
YANKOV VLADIMIR0 citations39
US8854710B2Oct 7, 2014
Method of laser illumination with reduced speckling
YANKOV VLADIMIR0 citations39
ADVANCED ION TECHNOLOGY INC
7 patentsUS6002208ADec 14, 1999
Universal cold-cathode type ion source with closed-loop electron drifting and adjustable ion-emitting slit
ADVANCED ION TECHNOLOGY INC183 citations98
US6214183B1Apr 10, 2001
Combined ion-source and target-sputtering magnetron and a method for sputtering conductive and nonconductive materials
ADVANCED ION TECHNOLOGY INC86 citations97
US6153067ANov 28, 2000
Method for combined treatment of an object with an ion beam and a magnetron plasma with a combined magnetron-plasma and ion-beam source
ADVANCED ION TECHNOLOGY INC102 citations97
US6037717AMar 14, 2000
Cold-cathode ion source with a controlled position of ion beam
ADVANCED ION TECHNOLOGY INC109 citations97
US6130507AOct 10, 2000
Cold-cathode ion source with propagation of ions in the electron drift plane
ADVANCED ION TECHNOLOGY INC80 citations94
US6246059B1Jun 12, 2001
Ion-beam source with virtual anode
ADVANCED ION TECHNOLOGY INC42 citations92
US6238526B1May 29, 2001
Ion-beam source with channeling sputterable targets and a method for channeled sputtering
ADVANCED ION TECHNOLOGY INC41 citations92
(unassigned)
4 patentsUS6250250B1Jun 26, 2001
Multiple-cell source of uniform plasma
571 citations98
US6801044B2Oct 5, 2004
Universal electromagnetic resonance system for detecting and measuring local non-uniformities in metal and non-metal objects
17 citations91
US6236163B1May 22, 2001
Multiple-beam ion-beam assembly
48 citations91
US6242749B1Jun 5, 2001
Ion-beam source with uniform distribution of ion-current density on the surface of an object being treated
18 citations84
MULTIMETRIXS LLC
3 patentsUS6989675B2Jan 24, 2006
Method and apparatus for precision measurement of film thickness
MULTIMETRIXS LLC59 citations94
US6891380B2May 10, 2005
System and method for measuring characteristics of materials with the use of a composite sensor
MULTIMETRIXS LLC21 citations91
US6815958B2Nov 9, 2004
Method and apparatus for measuring thickness of thin films with improved accuracy
MULTIMETRIXS LLC18 citations91