P

Inventor

SHEN CHIH-HENG

TW32 patents
⚠️ This page may combine multiple inventors who share the name “SHEN CHIH-HENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG

23 patents
US5723385AMar 3, 1998

Wafer edge seal ring structure

TAIWAN SEMICONDUCTOR MFG46 citations93
US6380030B1Apr 30, 2002

Implant method for forming Si3N4 spacer

TAIWAN SEMICONDUCTOR MFG25 citations92
US5783097AJul 21, 1998

Process to avoid dielectric damage at the flat edge of the water

TAIWAN SEMICONDUCTOR MFG28 citations92
US5747383AMay 5, 1998

Method for forming conductive lines and stacked vias

TAIWAN SEMICONDUCTOR MFG27 citations92
US6627971B1Sep 30, 2003

Polysilicon structures with different resistance values for gate electrodes, resistors, and capacitor plates

TAIWAN SEMICONDUCTOR MFG21 citations91
US6071826AJun 6, 2000

Method of manufacturing CMOS image sensor leakage free with double layer spacer

TAIWAN SEMICONDUCTOR MFG38 citations90
US5591673AJan 7, 1997

Tungsten stud process for stacked via applications

TAIWAN SEMICONDUCTOR MFG32 citations88
US6627475B1Sep 30, 2003

Buried photodiode structure for CMOS image sensor

TAIWAN SEMICONDUCTOR MFG15 citations83
US6803327B1Oct 12, 2004

Cost effective polymide process to solve passivation extrusion or damage and SOG delminates

TAIWAN SEMICONDUCTOR MFG14 citations80
US5668401ASep 16, 1997

Chessboard pattern layout for scribe lines

TAIWAN SEMICONDUCTOR MFG11 citations74
US6624466B2Sep 23, 2003

Implant method for forming Si3N4 spacer

TAIWAN SEMICONDUCTOR MFG7 citations73
US6407433B1Jun 18, 2002

Preventing gate oxide damage by post poly definition implantation while gate mask is on

TAIWAN SEMICONDUCTOR MFG5 citations73
US6162584ADec 19, 2000

Method of fabricating polysilicon structures with different resistance values for gate electrodes, resistors and capacitor plates in an integrated circuit

TAIWAN SEMICONDUCTOR MFG14 citations73
US6147372ANov 14, 2000

Layout of an image sensor for increasing photon induced current

TAIWAN SEMICONDUCTOR MFG8 citations73
US9312348B2Apr 12, 2016

Ultra high voltage semiconductor device with electrostatic discharge capabilities

TAIWAN SEMICONDUCTOR MFG3 citations72
US6143474ANov 7, 2000

Method of fabricating polysilicon structures with different resistance values for gate electrodes, resistors, and capacitor plates

TAIWAN SEMICONDUCTOR MFG7 citations72
US5929509AJul 27, 1999

Wafer edge seal ring structure

TAIWAN SEMICONDUCTOR MFG12 citations71
US5913979AJun 22, 1999

Method for removing spin-on-glass at wafer edge

TAIWAN SEMICONDUCTOR MFG12 citations71
US5492868AFeb 20, 1996

Capped reflow process to avoid contact autodoping and supress tungsten silicide peeling

TAIWAN SEMICONDUCTOR MFG9 citations68
US6995064B2Feb 7, 2006

Halogen gettering method for forming field effect transistor (FET) device

TAIWAN SEMICONDUCTOR MFG2 citations62
US6187639B1Feb 13, 2001

Method to prevent gate oxide damage by post poly definition implantation

TAIWAN SEMICONDUCTOR MFG3 citations62
US9166046B2Oct 20, 2015

Semiconductor device and method of manufacturing

TAIWAN SEMICONDUCTOR MFG3 citations61
US6949471B2Sep 27, 2005

Method for fabricating poly patterns

TAIWAN SEMICONDUCTOR MFG0 citations52

TAIWAN SEMICONDUCTOR MFG CO LTD

9 patents