P

Inventor

YASUDA MASAHIKO

JP36 patents
⚠️ This page may combine multiple inventors who share the name “YASUDA MASAHIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NIKON CORP

18 patents
US6876946B2Apr 5, 2005

Alignment method and apparatus therefor

NIKON CORP80 citations98
US6278957B1Aug 21, 2001

Alignment method and apparatus therefor

NIKON CORP116 citations98
US6549271B2Apr 15, 2003

Exposure apparatus and method

NIKON CORP58 citations96
US5601957AFeb 11, 1997

Micro devices manufacturing method comprising the use of a second pattern overlying an alignment mark to reduce flattening

NIKON CORP43 citations96
US5795687AAug 18, 1998

Projection exposure method and alignment

NIKON CORP35 citations92
US6888621B2May 3, 2005

Mask-holding apparatus for a light exposure apparatus and related scanning-exposure method

NIKON CORP32 citations91
US6110021AAug 29, 2000

Micro devices manufacturing method and apparatus therefor

NIKON CORP12 citations82
US6641962B2Nov 4, 2003

Micro devices manufacturing method utilizing concave and convex alignment mark patterns

NIKON CORP5 citations74
US6566022B2May 20, 2003

Micro devices manufacturing method and apparatus therefor

NIKON CORP7 citations74
US10222708B2Mar 5, 2019

Position measurement method, position control method, measurement method, loading method, exposure method and exposure apparatus, and device manufacturing method

NIKON CORP1 citations72
US10209623B2Feb 19, 2019

Exposure apparatus, exposure method, and method for producing device

NIKON CORP1 citations71
US6306548B1Oct 23, 2001

Micro devices manufacturing method and apparatus therefor

NIKON CORP1 citations63
US9348238B2May 24, 2016

Position measurement method, position control method, measurement method, loading method, exposure method and exposure apparatus, and device manufacturing method

NIKON CORP1 citations62
US9298108B2Mar 29, 2016

Position measurement method, position control method, measurement method, loading method, exposure method and exposure apparatus, and device manufacturing method

NIKON CORP2 citations62
US9383656B2Jul 5, 2016

Exposure apparatus, exposure method, and method for producing device

NIKON CORP1 citations61
US9223230B2Dec 29, 2015

Position measurement method, position control method, measurement method, loading method, exposure method and exposure apparatus, and device manufacturing method

NIKON CORP0 citations51
US9223231B2Dec 29, 2015

Position measurement method, position control method, measurement method, loading method, exposure method and exposure apparatus, and device manufacturing method

NIKON CORP0 citations51
US8054465B2Nov 8, 2011

Position measurement method

NIKON CORP0 citations51

YASUDA MASAHIKO

5 patents

KYOWA HAKKO KOGYO KK

4 patents

GOODRICH CO B F

3 patents

KYOWA YUKA KK

2 patents

KOBAYASHI MITSURU

2 patents

NIPPON KOGAKU KK

1 patent

JIDOSHA DENKI KOGYO KK

1 patent