Inventor
GRANNES DEAN J
US3 patents
Patents
3 patentsUS6596980B2Jul 22, 2003
Method and apparatus to measure statistical variation of electrical signal phase in integrated circuits using time-correlated photon counting
INTEL CORP13 citations82
US7018095B2Mar 28, 2006
Circuit for sensing on-die temperature at multiple locations
INTEL CORP11 citations80
US6519744B2Feb 11, 2003
Semiconductor die manufacture method to limit a voltage drop on a power plane thereof by noninvasively measuring voltages on a power plane
INTEL CORP4 citations57