Inventor

SIJBRANDIJ SYBREN J

US2 patents

⚠️ This page may combine multiple inventors who share the name “SIJBRANDIJ SYBREN J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FEI CO

1 patent

US7727681B2Jun 1, 2010

Electron beam processing for mask repair

FEI CO9 citations80

CARL ZEISS MICROSCOPY LLC

1 patent

US10037862B2Jul 31, 2018

Charged particle detecting device and charged particle beam system with same

CARL ZEISS MICROSCOPY LLC0 citations38