Inventor
ISHIGURO TAKAYUKI
JP19 patents
⚠️ This page may combine multiple inventors who share the name “ISHIGURO TAKAYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NTT DOCOMO INC
11 patentsUS7151948B2Dec 19, 2006
Scheme for realizing path selection using optimum path selection threshold in radio communication
NTT DOCOMO INC20 citations92
US7035590B2Apr 25, 2006
Mobile communication terminal, interference cancellation system, interference cancellation method, and base station
NTT DOCOMO INC12 citations84
US6961577B2Nov 1, 2005
Radio communication system for reducing interferences with respect to other communication system using close frequency band
NTT DOCOMO INC15 citations83
US7668142B2Feb 23, 2010
Radio communications system, radio communications method, radio relay, and radio terminal
NTT DOCOMO INC2 citations63
US7539173B2May 26, 2009
Radio communication system, radio terminal, base station, control equipment and communication method
NTT DOCOMO INC6 citations63
US7039406B2May 2, 2006
Radio communication method, radio base station and radio terminal
NTT DOCOMO INC6 citations63
US7155233B2Dec 26, 2006
Radio communication system for reducing interferences with respect to other communication system using close frequency band
NTT DOCOMO INC3 citations62
US6859647B2Feb 22, 2005
Interference elimination system and interference eliminating method
NTT DOCOMO INC1 citations52
US7720478B2May 18, 2010
Control device of mobile communication system
NTT DOCOMO INC1 citations51
US7194265B2Mar 20, 2007
Method and system for determining antenna of radio base station at moving target area during handover
NTT DOCOMO INC0 citations42
US7558236B2Jul 7, 2009
Communication method and system for improving control signal receiving quality during handover
NTT DOCOMO INC0 citations41
HITACHI ELECTR ENG
5 patentsUS6617603B2Sep 9, 2003
Surface defect tester
HITACHI ELECTR ENG43 citations92
US6509966B2Jan 21, 2003
Optical system for detecting surface defect and surface defect tester using the same
HITACHI ELECTR ENG45 citations92
US5898491AApr 27, 1999
Surface defect test method and surface defect tester
HITACHI ELECTR ENG41 citations92
US5875027AFeb 23, 1999
Sensitivity calibration disk for surface defect tester
HITACHI ELECTR ENG16 citations73
US5877857AMar 2, 1999
Eccentricity tester for head turnout zone of magnetic disk and testing method thereof
HITACHI ELECTR ENG2 citations60