Inventor

NINOMIYA TAKANORI

JP69 patents

⚠️ This page may combine multiple inventors who share the name “NINOMIYA TAKANORI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NINOMIYA TAKANORI

HITACHI LTD

Method of inspecting a circuit pattern and inspecting instrument

Optical apparatus for defect and particle size inspection

Thin film thickness measuring method and apparatus, and method and apparatus for manufacturing a thin film device using the same

Method and apparatus for inspection and correction of wiring of electronic circuit and for manufacture thereof

Method for producing thin film multilayer substrate, and method and apparatus for detecting circuit conductor pattern of the substrate

Identification method for an article using crystal defects

Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof

Apparatus and method for inspector defects

Method of inspecting pattern and apparatus thereof

Method of and apparatus for checking geometry of multi-layer patterns for IC structures

Robot vision system

Robot system for recognizing three dimensional shapes

Method of detecting defects on an object

Method and apparatus for automatic focusing and a method and apparatus for three dimensional profile detection

Method and apparatus for detecting photoacoustic signal to detect surface and subsurface information of the specimen

Apparatus and method for inspecting soldered portions

Method of inspecting a semiconductor device and an apparatus thereof

Method of inspecting a circuit pattern and inspecting instrument

Apparatus and method for inspecting defects

Semiconductor manufacturing methods, plasma processing methods and plasma processing apparatuses

Semiconductor manufacturing methods, plasma processing methods and plasma processing apparatuses

Method and device for detecting end point of plasma treatment, method and device for manufacturing semiconductor device, and semiconductor device

Method and apparatus for inspecting defects of surface shape

Method and apparatus for detecting photoacoustic signal

Inspection method and apparatus for joint junction states

Apparatus and method for testing defects

Apparatus and method for testing defects

Apparatus and method for testing defects

Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof

Method for inspecting defect and system therefor

Method of inspecting pattern and apparatus thereof with a differential brightness image detection

Temperature measuring method using thermal expansion and an apparatus for carrying out the same

Method for inspecting filled state of via-holes filled with fillers and apparatus for carrying out the method

Pattern defects detection method and apparatus

Method and apparatus for detecting defects of printed circuit patterns

Inspection method for soldered joints using x-ray imaging and apparatus therefor

Method of and apparatus for inspection of external appearance of a circuit substrate, and for displaying abnormality information thereof

Resolving power evaluation method and specimen for electron microscope

HITACHI HIGH TECH CORP

Apparatus and method for testing defects

Apparatus and method for testing defects

Method of inspecting a semiconductor device and an apparatus thereof

HITACHI AUTOMOTIVE SYSTEMS LTD

Power module, power converter device, and electrically powered vehicle

Power module, power converter device, and electrically powered vehicle

Power module, power converter device, and electrically powered vehicle

HITACHI HIGH TECH ELECT ENG CO

Method of inspecting a semiconductor device and an apparatus thereof

SEIKO EPSON CORP

Liquid crystal device and electronic apparatus

NAKATSU KINYA

Power module, power converter device, and electrically powered vehicle

TOYODA MACHINE WORKS LTD

Grinding wheel

(unassigned)

Method and apparatus for measuring the size of a circuit or wiring pattern formed on a hybrid integrated circuit chip and a wiring board respectively

HITACHI ASTEMO LTD

Power module, power converter device, and electrically powered vehicle