Inventor
SEKIZAWA AKIHIKO
JP2 patents
Patents
2 patentsUS11074681B2Jul 27, 2021
Anomalousness determination method, anomalousness determination apparatus, and computer-readable recording medium
FUJITSU LTD0 citations56
US11291431B2Apr 5, 2022
Examination assisting method, examination assisting apparatus, and computer-readable recording medium
FUJITSU LTD0 citations46