Inventor
OMINAMI YUSUKE
JP36 patents
⚠️ This page may combine multiple inventors who share the name “OMINAMI YUSUKE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
26 patentsUS9508527B2Nov 29, 2016
Sample base, charged particle beam device and sample observation method
HITACHI HIGH TECH CORP8 citations84
USD748706SFeb 2, 2016
Thin membrane holder for an electron microscope
HITACHI HIGH TECH CORP6 citations83
USD730962SJun 2, 2015
Base of a thin membrane holder for an electron microscope
HITACHI HIGH TECH CORP6 citations83
US9418818B2Aug 16, 2016
Charged particle beam device and sample observation method
HITACHI HIGH TECH CORP4 citations73
US10241062B2Mar 26, 2019
Charged particle beam device, sample observation method, sample platform, observation system, and light emitting member
HITACHI HIGH TECH CORP4 citations72
US9472375B2Oct 18, 2016
Charged particle beam device, sample stage unit, and sample observation method
HITACHI HIGH TECH CORP3 citations72
US10431416B2Oct 1, 2019
Observation support unit for charged particle microscope and sample observation method using same
HITACHI HIGH TECH CORP2 citations70
US8921786B2Dec 30, 2014
Charged particle beam apparatus
HITACHI HIGH TECH CORP3 citations62
US7838828B2Nov 23, 2010
Semiconductor device inspection apparatus
HITACHI HIGH TECH CORP4 citations59
US9673020B2Jun 6, 2017
Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sample
HITACHI HIGH TECH CORP0 citations52
US9466460B2Oct 11, 2016
Charged particle-beam device and specimen observation method
HITACHI HIGH TECH CORP1 citations52
US9105442B2Aug 11, 2015
Charged particle beam apparatus
HITACHI HIGH TECH CORP0 citations52
US10157724B2Dec 18, 2018
Electron scanning microscope and image generation method
HITACHI HIGH TECH CORP0 citations51
US9824854B2Nov 21, 2017
Charged particle beam device, image generation method, observation system
HITACHI HIGH TECH CORP0 citations51
US9741530B2Aug 22, 2017
Charged-particle-beam device, specimen-image acquisition method, and program recording medium
HITACHI HIGH TECH CORP1 citations51
US9633817B2Apr 25, 2017
Diaphragm mounting member and charged particle beam device
HITACHI HIGH TECH CORP1 citations51
US9236217B2Jan 12, 2016
Inspection or observation apparatus and sample inspection or observation method
HITACHI HIGH TECH CORP0 citations51
US9362083B2Jun 7, 2016
Charged particle beam apparatus and sample observation method
HITACHI HIGH TECH CORP0 citations46
US9208995B2Dec 8, 2015
Charged particle beam apparatus
HITACHI HIGH TECH CORP0 citations42
US9741526B2Aug 22, 2017
Charged particle beam apparatus and sample image acquiring method
HITACHI HIGH TECH CORP0 citations41
US9564288B2Feb 7, 2017
Sample storage container, charged particle beam apparatus, and image acquiring method
HITACHI HIGH TECH CORP0 citations41
US9466457B2Oct 11, 2016
Observation apparatus and optical axis adjustment method
HITACHI HIGH TECH CORP0 citations41
US9373480B2Jun 21, 2016
Charged particle beam device and filter member
HITACHI HIGH TECH CORP0 citations41
US9263232B2Feb 16, 2016
Charged particle beam device
HITACHI HIGH TECH CORP0 citations41
US9251996B2Feb 2, 2016
Charged particle beam device, position adjusting method for diaphragm, and diaphragm position adjusting jig
HITACHI HIGH TECH CORP0 citations41
US9240305B2Jan 19, 2016
Charged particle beam device and sample observation method
HITACHI HIGH TECH CORP0 citations41
OMINAMI YUSUKE
6 patentsUS8710439B2Apr 29, 2014
Charged particle beam apparatus
OMINAMI YUSUKE15 citations91
US8933400B2Jan 13, 2015
Inspection or observation apparatus and sample inspection or observation method
OMINAMI YUSUKE5 citations71
US9543111B2Jan 10, 2017
Charged particle beam device
OMINAMI YUSUKE3 citations70
US8086021B2Dec 27, 2011
Appearance inspection apparatus with scanning electron microscope and image data processing method using scanning electron microscope
OMINAMI YUSUKE2 citations62
US9165741B2Oct 20, 2015
Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sample
OMINAMI YUSUKE0 citations51
US8242443B2Aug 14, 2012
Semiconductor device inspection apparatus
OMINAMI YUSUKE0 citations47