Inventor
LEVI ELI
US41 patents
⚠️ This page may combine multiple inventors who share the name “LEVI ELI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANCED TESTING TECHNOLOGIES INC
11 patentsUS8356282B1Jan 15, 2013
Integrated development environment for the development of electronic signal testing strategies
ADVANCED TESTING TECHNOLOGIES INC38 citations93
US9295169B1Mar 22, 2016
Common chassis for instrumentation
ADVANCED TESTING TECHNOLOGIES INC17 citations92
US8817109B1Aug 26, 2014
Techniques for capturing and generating a DVI signal
ADVANCED TESTING TECHNOLOGIES INC10 citations83
US8655617B1Feb 18, 2014
Method and system for validating video waveforms and other electrical signals
ADVANCED TESTING TECHNOLOGIES INC9 citations83
US9291677B1Mar 22, 2016
Test system and method for testing electromechanical components
ADVANCED TESTING TECHNOLOGIES INC13 citations82
US8359504B1Jan 22, 2013
Digital functional test system
ADVANCED TESTING TECHNOLOGIES INC7 citations79
US8996742B1Mar 31, 2015
Method for automatically testing video display/monitors using embedded data structure information
ADVANCED TESTING TECHNOLOGIES INC4 citations72
US9007259B1Apr 14, 2015
Flight line noise tester
ADVANCED TESTING TECHNOLOGIES INC6 citations70
US9231354B1Jan 5, 2016
Interconnections for axial cables
ADVANCED TESTING TECHNOLOGIES INC2 citations62
US8782558B1Jul 15, 2014
Method, program and arrangement for highlighting failing elements of a visual image
ADVANCED TESTING TECHNOLOGIES INC3 citations62
US8643725B1Feb 4, 2014
Method and system for validating video apparatus in an active environment
ADVANCED TESTING TECHNOLOGIES INC3 citations62
ADVANCED TESTING TECH INC
10 patentsUS9739827B1Aug 22, 2017
Automated waveform analysis using a parallel automated development system
ADVANCED TESTING TECH INC26 citations92
US10097818B1Oct 9, 2018
Video processor with digital video signal processing capabilities
ADVANCED TESTING TECH INC10 citations83
US10151791B1Dec 11, 2018
Automated waveform analysis methods using a parallel automated development system
ADVANCED TESTING TECH INC12 citations82
US9933984B1Apr 3, 2018
Method and arrangement for eye diagram display of errors of digital waveforms
ADVANCED TESTING TECH INC2 citations72
US9480184B1Oct 25, 2016
Instrumentation chassis within a module
ADVANCED TESTING TECH INC2 citations62
US10598722B1Mar 24, 2020
Automated waveform analysis methods using a parallel automated development system
ADVANCED TESTING TECH INC1 citations61
US9488673B1Nov 8, 2016
Multi-standard instrumentation chassis
ADVANCED TESTING TECH INC2 citations61
US9961787B1May 1, 2018
Multi-standard instrumentation chassis
ADVANCED TESTING TECH INC0 citations51
US9864003B1Jan 9, 2018
Automated waveform analysis using a parallel automated development system
ADVANCED TESTING TECH INC0 citations50
US10025890B2Jul 17, 2018
Phase noise simulation model for pulse doppler radar target detection
ADVANCED TESTING TECH INC0 citations38
ATTI INT SERVICES COMPANY INC
5 patentsUS9401021B1Jul 26, 2016
Method and system for identifying anomalies in medical images especially those including body parts having symmetrical properties
ATTI INT SERVICES COMPANY INC25 citations93
US10588814B1Mar 17, 2020
Enhanced visual and audio cueing system for rollators
ATTI INT SERVICES COMPANY INC14 citations85
US9779504B1Oct 3, 2017
Method and system for identifying anomalies in medical images especially those including one of a pair of symmetric body parts
ATTI INT SERVICES COMPANY INC19 citations83
US10064782B1Sep 4, 2018
Mobility assistance device
ATTI INT SERVICES COMPANY INC14 citations82
US9860568B2Jan 2, 2018
World view window
ATTI INT SERVICES COMPANY INC0 citations41
ATTI INTERNAT SERVICES COMPANY INC
3 patentsUS8724871B1May 13, 2014
Method and system for identifying anomalies in medical images
ATTI INTERNAT SERVICES COMPANY INC22 citations91
US9177379B1Nov 3, 2015
Method and system for identifying anomalies in medical images
ATTI INTERNAT SERVICES COMPANY INC14 citations82
US8530851B2Sep 10, 2013
Electron beam profile measurement system and method with optional Faraday cup
ATTI INTERNAT SERVICES COMPANY INC11 citations80
ABGARYAN ARTUSH A
3 patentsUS8253315B2Aug 28, 2012
Crossover point regulation method for electro-static focusing systems
ABGARYAN ARTUSH A0 citations47
US8084930B2Dec 27, 2011
Multiple device shaping uniform distribution of current density in electro-static focusing systems
ABGARYAN ARTUSH A1 citations47
US8084929B2Dec 27, 2011
Multiple device shaping uniform distribution of current density in electro-static focusing systems
ABGARYAN ARTUSH A1 citations47